Correction to: Test-retest reliability of the computer-assisted DIA-X-5 interview for mental disorders

An amendment to this paper has been published and can be accessed via the original article.

Bibliographic Details
Main Authors: Jana Hoyer, Catharina Voss, Jens Strehle, John Venz, Lars Pieper, Hans-Ulrich Wittchen, Stefan Ehrlich, Katja Beesdo-Baum
Format: Article
Language:English
Published: BMC 2020-07-01
Series:BMC Psychiatry
Online Access:http://link.springer.com/article/10.1186/s12888-020-02762-2

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