Experimental Studies of New GaAs Metal/Insulator/p-n+ Switches Using Low Temperature Oxide
First observation of switching behavior is reported in GaAs metal-insulator-p-n+ structure, where the thin insulator is grown at low temperature by a liquid phase chemical-enhanced oxide (LPECO) with a thickness of 100 Å. A significant S-shaped negative differential resistance (NDR) is shown to occ...
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Hindawi Limited
2002-01-01
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Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1080/08827510213494 |
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doaj-40408e9179174183a4c9741c091b4c552020-11-24T22:36:42ZengHindawi LimitedActive and Passive Electronic Components0882-75161563-50312002-01-0125323323710.1080/08827510213494Experimental Studies of New GaAs Metal/Insulator/p-n+ Switches Using Low Temperature OxideK. F. Yarn0Far East College, Department of Electrical Engineering, Optoelectronic Semiconductor Center, Hsin-Shih Tainan Taiwan 744, ChinaFirst observation of switching behavior is reported in GaAs metal-insulator-p-n+ structure, where the thin insulator is grown at low temperature by a liquid phase chemical-enhanced oxide (LPECO) with a thickness of 100 Å. A significant S-shaped negative differential resistance (NDR) is shown to occur that originates from the regenerative feedback in a tunnel metal/insulator/semiconductor (MIS) interface and p-n+ junction. The influence of epitaxial doping concentration on the switching and holding voltages is investigated. The switching voltages are found to be decreased when increasing the epitaxial doping concentration, while the holding voltages are almost kept constant. A high turn-off/turn-on resistance ratio up to 105 has been obtained.http://dx.doi.org/10.1080/08827510213494 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
K. F. Yarn |
spellingShingle |
K. F. Yarn Experimental Studies of New GaAs Metal/Insulator/p-n+ Switches Using Low Temperature Oxide Active and Passive Electronic Components |
author_facet |
K. F. Yarn |
author_sort |
K. F. Yarn |
title |
Experimental Studies of New GaAs Metal/Insulator/p-n+
Switches Using Low Temperature Oxide |
title_short |
Experimental Studies of New GaAs Metal/Insulator/p-n+
Switches Using Low Temperature Oxide |
title_full |
Experimental Studies of New GaAs Metal/Insulator/p-n+
Switches Using Low Temperature Oxide |
title_fullStr |
Experimental Studies of New GaAs Metal/Insulator/p-n+
Switches Using Low Temperature Oxide |
title_full_unstemmed |
Experimental Studies of New GaAs Metal/Insulator/p-n+
Switches Using Low Temperature Oxide |
title_sort |
experimental studies of new gaas metal/insulator/p-n+
switches using low temperature oxide |
publisher |
Hindawi Limited |
series |
Active and Passive Electronic Components |
issn |
0882-7516 1563-5031 |
publishDate |
2002-01-01 |
description |
First observation of switching behavior is reported in GaAs metal-insulator-p-n+
structure, where the thin insulator is
grown at low temperature by a liquid phase chemical-enhanced oxide (LPECO) with a thickness of 100 Å. A significant S-shaped negative differential resistance (NDR) is shown to occur that originates from the regenerative feedback in a tunnel metal/insulator/semiconductor (MIS) interface and p-n+
junction. The influence of epitaxial doping concentration on the switching and holding voltages is investigated. The switching voltages are found to be decreased when increasing the epitaxial doping concentration, while the holding voltages are almost kept constant. A high turn-off/turn-on resistance ratio up to 105
has been obtained. |
url |
http://dx.doi.org/10.1080/08827510213494 |
work_keys_str_mv |
AT kfyarn experimentalstudiesofnewgaasmetalinsulatorpnswitchesusinglowtemperatureoxide |
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1725718743014703104 |