Sılar metodu ile hazırlanan Cu2O ince filmlerin fiziksel özellikleri

Sılar metodu ile hazırlanan Cu2O ince filmlerin fiziksel özellikleri

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Silar metodu kullanılarak 70 °C’de cam alttabanlar üzerine polikristal Cu2O ince filmleri elde edildi. XRD analizleri filmlerin kübik yapıda olduğunu gösterdi ve örgü parametreleri hesaplandı. Filmlerin yüzey morfolojisi alan emisyonlu taramalı elektron mikroskobu (FE-SEM) ile görüntülendi. Filmleri...

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Bibliographic Details
Main Authors:	Doğan Özaslan, Mustafa Güneş, Cebrail Gümüş
Format:	Article
Language:	English
Published:	Pamukkale University 2017-12-01
Series:	Pamukkale University Journal of Engineering Sciences
Subjects:	Silar method Thin film Cu2O Physical properties Silar metodu İnce film Fiziksel özellikler
Online Access:	http://dergipark.gov.tr/pajes/issue/33120/377669?publisher=pamukkale

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