Microstructure and Flow Stress of Nanoscale Cu/Nb Multilayers

Nanoscale Cu/Nb multilayers with individual layer thicknesses of 2, 5, and 15 nm were prepared by d.c. magnetron sputtering. The cross-sectional morphologies of the multilayers were examined under transmission electron microscopy (TEM) as well as high resolution TEM, whilst the flow stresses were me...

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Bibliographic Details
Main Authors: F. Wang, L. F. Zhang, P. Huang, J. Y. Xie, T. J. Lu, K. W. Xu
Format: Article
Language:English
Published: Hindawi Limited 2013-01-01
Series:Journal of Nanomaterials
Online Access:http://dx.doi.org/10.1155/2013/912548

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