Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid
In this study, effect of potential on composition and depth profiles of passive films formed on 316L stainless steel in 0.05 M sulfuric acid has been examined using X-ray photoelectron spectroscopy (XPS). For passive film formation within the passive region, four potentials -0.2, 0.2, 0.5, and 0.8 V...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | fas |
| Published: |
Isfahan University of Technology
2013-12-01
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| Series: | Journal of Advanced Materials in Engineering |
| Subjects: | |
| Online Access: | http://jame.iut.ac.ir/article-1-562-en.html |