High-Density SRAM Read Access Yield Estimation Methodology

High-Density SRAM Read Access Yield Estimation Methodology

As high-density SRAMs must be designed to ensure a substantially small failure rate, the accurate yield estimation with practically acceptable runtime of circuit simulations is highly challenging. Here, a read access yield estimation method for high-density static random access memory (SRAM) is prop...

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Bibliographic Details
Main Authors: Gidong Baek, Hanwool Jeong
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Process variation
read access yield
sensing yield
static random access memory (SRAM)
yield estimation
Online Access:https://ieeexplore.ieee.org/document/9535149/

Internet

https://ieeexplore.ieee.org/document/9535149/

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