Trends in the development of the epitaxial nitride compounds technology

The main trends in the development of technology for nitride heterostructures element base of microwave-technology and power electronics, as well as light-emitting diodes have been reviewed. It has been noted that most modern technological focus is the development of nitride heterostructures on sili...

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Main Authors: Aleksei A. Arendarenko, Viktor A. Oreshkin, Yurii N. Sveshnikov, Igor N. Tsyplenkov
Format: Article
Language:English
Published: Pensoft Publishers 2016-06-01
Series:Modern Electronic Materials
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2452177916300652
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spelling doaj-3b89f59e4be8431f9c4e09575a8d2e1c2021-04-02T16:07:59ZengPensoft PublishersModern Electronic Materials2452-17792016-06-0122334010.1016/j.moem.2016.10.001Trends in the development of the epitaxial nitride compounds technologyAleksei A. ArendarenkoViktor A. OreshkinYurii N. SveshnikovIgor N. TsyplenkovThe main trends in the development of technology for nitride heterostructures element base of microwave-technology and power electronics, as well as light-emitting diodes have been reviewed. It has been noted that most modern technological focus is the development of nitride heterostructures on silicon substrates. The basic problems of nitride compounds on silicon substrate and the ways of their solution have been discussed. Some results of GaN/Si heterostructures technology development in “Elma-Malachit” JSC have been presented. The AlGaN/GaN/Si heterostructures have been grown by MOCVD. We show that early process stages such as Si-surface treatment and Al pre-deposition are of great importance for the growth of crack-free structures with good structural and surface quality. Meanwhile the surface curvature of the grown structures is influenced mainly by the composition of the multilayered transition region between the AlN nucleation layer and the GaN layer. Transistors fabricated on AlGaN/GaN structures grown on Si substrates under optimized conditions demonstrated rather good static characteristics: Id,max=800 mA/mm, Ubr>120 V, gm=170 mS/mm. For further technology development experimental and technological work should be arranged in close coordination with analytical prediction and calculation of properties of the grown material with mathematical modeling methods. This approach will help enhance the efficiency of technology development and deepen scientific views on the processes responsible for the formation of properties of heterostructures.http://www.sciencedirect.com/science/article/pii/S2452177916300652Gallium nitrideSilicon carbideSiliconSupphireHeterostructureSubstrateHeteroepitaxyTechnology
collection DOAJ
language English
format Article
sources DOAJ
author Aleksei A. Arendarenko
Viktor A. Oreshkin
Yurii N. Sveshnikov
Igor N. Tsyplenkov
spellingShingle Aleksei A. Arendarenko
Viktor A. Oreshkin
Yurii N. Sveshnikov
Igor N. Tsyplenkov
Trends in the development of the epitaxial nitride compounds technology
Modern Electronic Materials
Gallium nitride
Silicon carbide
Silicon
Supphire
Heterostructure
Substrate
Heteroepitaxy
Technology
author_facet Aleksei A. Arendarenko
Viktor A. Oreshkin
Yurii N. Sveshnikov
Igor N. Tsyplenkov
author_sort Aleksei A. Arendarenko
title Trends in the development of the epitaxial nitride compounds technology
title_short Trends in the development of the epitaxial nitride compounds technology
title_full Trends in the development of the epitaxial nitride compounds technology
title_fullStr Trends in the development of the epitaxial nitride compounds technology
title_full_unstemmed Trends in the development of the epitaxial nitride compounds technology
title_sort trends in the development of the epitaxial nitride compounds technology
publisher Pensoft Publishers
series Modern Electronic Materials
issn 2452-1779
publishDate 2016-06-01
description The main trends in the development of technology for nitride heterostructures element base of microwave-technology and power electronics, as well as light-emitting diodes have been reviewed. It has been noted that most modern technological focus is the development of nitride heterostructures on silicon substrates. The basic problems of nitride compounds on silicon substrate and the ways of their solution have been discussed. Some results of GaN/Si heterostructures technology development in “Elma-Malachit” JSC have been presented. The AlGaN/GaN/Si heterostructures have been grown by MOCVD. We show that early process stages such as Si-surface treatment and Al pre-deposition are of great importance for the growth of crack-free structures with good structural and surface quality. Meanwhile the surface curvature of the grown structures is influenced mainly by the composition of the multilayered transition region between the AlN nucleation layer and the GaN layer. Transistors fabricated on AlGaN/GaN structures grown on Si substrates under optimized conditions demonstrated rather good static characteristics: Id,max=800 mA/mm, Ubr>120 V, gm=170 mS/mm. For further technology development experimental and technological work should be arranged in close coordination with analytical prediction and calculation of properties of the grown material with mathematical modeling methods. This approach will help enhance the efficiency of technology development and deepen scientific views on the processes responsible for the formation of properties of heterostructures.
topic Gallium nitride
Silicon carbide
Silicon
Supphire
Heterostructure
Substrate
Heteroepitaxy
Technology
url http://www.sciencedirect.com/science/article/pii/S2452177916300652
work_keys_str_mv AT alekseiaarendarenko trendsinthedevelopmentoftheepitaxialnitridecompoundstechnology
AT viktoraoreshkin trendsinthedevelopmentoftheepitaxialnitridecompoundstechnology
AT yuriinsveshnikov trendsinthedevelopmentoftheepitaxialnitridecompoundstechnology
AT igorntsyplenkov trendsinthedevelopmentoftheepitaxialnitridecompoundstechnology
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