Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray Photoemission

Bibliographic Details
Main Authors: Xiaxia Liao, Ah Reum Jeong, Regan G. Wilks, Sven Wiesner, Marin Rusu, Roberto Félix, Ting Xiao, Claudia Hartmann, Marcus Bär
Format: Article
Language:English
Published: American Chemical Society 2019-06-01
Series:ACS Omega
Online Access:http://dx.doi.org/10.1021/acsomega.9b01027
id doaj-3b699f5cddaf457bbfb802a5c5cfed90
record_format Article
spelling doaj-3b699f5cddaf457bbfb802a5c5cfed902020-11-25T03:40:38ZengAmerican Chemical SocietyACS Omega2470-13432019-06-0146109851099010.1021/acsomega.9b01027Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray PhotoemissionXiaxia Liao0Ah Reum Jeong1Regan G. Wilks2Sven Wiesner3Marin Rusu4Roberto Félix5Ting Xiao6Claudia Hartmann7Marcus Bär8Department Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, GermanyDepartment Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, GermanyDepartment Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, GermanyDepartment Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, GermanyDepartment Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, GermanyDepartment Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, GermanyDepartment Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, GermanyDepartment Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, GermanyDepartment Interface Design, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, Germanyhttp://dx.doi.org/10.1021/acsomega.9b01027
collection DOAJ
language English
format Article
sources DOAJ
author Xiaxia Liao
Ah Reum Jeong
Regan G. Wilks
Sven Wiesner
Marin Rusu
Roberto Félix
Ting Xiao
Claudia Hartmann
Marcus Bär
spellingShingle Xiaxia Liao
Ah Reum Jeong
Regan G. Wilks
Sven Wiesner
Marin Rusu
Roberto Félix
Ting Xiao
Claudia Hartmann
Marcus Bär
Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray Photoemission
ACS Omega
author_facet Xiaxia Liao
Ah Reum Jeong
Regan G. Wilks
Sven Wiesner
Marin Rusu
Roberto Félix
Ting Xiao
Claudia Hartmann
Marcus Bär
author_sort Xiaxia Liao
title Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray Photoemission
title_short Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray Photoemission
title_full Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray Photoemission
title_fullStr Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray Photoemission
title_full_unstemmed Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray Photoemission
title_sort tunability of moo3 thin-film properties due to annealing in situ monitored by hard x‑ray photoemission
publisher American Chemical Society
series ACS Omega
issn 2470-1343
publishDate 2019-06-01
url http://dx.doi.org/10.1021/acsomega.9b01027
work_keys_str_mv AT xiaxialiao tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
AT ahreumjeong tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
AT regangwilks tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
AT svenwiesner tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
AT marinrusu tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
AT robertofelix tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
AT tingxiao tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
AT claudiahartmann tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
AT marcusbar tunabilityofmoo3thinfilmpropertiesduetoannealinginsitumonitoredbyhardxrayphotoemission
_version_ 1724533789718216704