Possible Pitfalls in the Analysis of Minerals and Loose Materials by Portable XRF, and How to Overcome Them

• Main Authors: Valérie Laperche, Bruno Lemière
• Format: Article
• Language: English
• Published: MDPI AG 2021-12-01
• Series: Minerals
• Subjects: pXRF; analytical mode; protective films; light elements; analytical interferences; matrix effects
• Online Access: https://www.mdpi.com/2075-163X/11/1/33

Portable X-ray fluorescence spectroscopy is now widely used in almost any field of geoscience. Handheld XRF analysers are easy to use, and results are available in almost real time anywhere. However, the results do not always match laboratory analyses, and this may deter users. Rather than analytical issues, the bias often results from sample preparation differences. Instrument setup and analysis conditions need to be fully understood to avoid reporting erroneous results. The technique’s limitations must be kept in mind. We describe a number of issues and potential pitfalls observed from our experience and described in the literature. This includes the analytical mode and parameters; protective films; sample geometry and density, especially for light elements; analytical interferences between elements; physical effects of the matrix and sample condition, and more. Nevertheless, portable X-ray fluorescence spectroscopy (pXRF) results gathered with sufficient care by experienced users are both precise and reliable, if not fully accurate, and they can constitute robust data sets. Rather than being a substitute for laboratory analyses, pXRF measurements are a valuable complement to those. pXRF improves the quality and relevance of laboratory data sets.