Feature-Learning-Based Printed Circuit Board Inspection via Speeded-Up Robust Features and Random Forest

Feature-Learning-Based Printed Circuit Board Inspection via Speeded-Up Robust Features and Random Forest

With the coming of the 4th industrial revolution era, manufacturers produce high-tech products. As the production process is refined, inspection technologies become more important. Specifically, the inspection of a printed circuit board (PCB), which is an indispensable part of electronic products, i...

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Bibliographic Details
Main Authors: Eun Hye Yuk, Seung Hwan Park, Cheong-Sool Park, Jun-Geol Baek
Format: Article
Language:English
Published: MDPI AG 2018-06-01
Series:Applied Sciences
Subjects:
image inspection
non-referential method
feature extraction
fault pattern learning
weighted kernel density estimation (WKDE)
Online Access:http://www.mdpi.com/2076-3417/8/6/932

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