High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric
Polyvinyl alcohol (PVA) and anodized Al2O3 layers were used as bi-layer gate for the fabrication of cobalt phthalocyanine (CoPc) wire base field-effect transistors (OFETs). CoPc wires were grown on SiO2 surfaces by organic vapor phase deposition method. These devices exhibit a field-effect carrier m...
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2013-11-01
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Online Access: | http://dx.doi.org/10.1063/1.4834355 |
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doaj-3794f5c0b36c498c98408935ffd8e2022020-11-24T21:17:49ZengAIP Publishing LLCAIP Advances2158-32262013-11-01311112123112123-710.1063/1.4834355022311ADVHigh carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectricMurali Gedda0Nimmakayala V. V. Subbarao1Sk. Md. Obaidulla2Dipak K. Goswami3Department of Physics, Indian Institute of Technology Guwahati, Guwahati-781039, IndiaCentre for Nano Technology, Indian Institute of Technology Guwahati, Guwahati-781039, IndiaDepartment of Physics, Indian Institute of Technology Guwahati, Guwahati-781039, IndiaDepartment of Physics, Indian Institute of Technology Guwahati, Guwahati-781039, IndiaPolyvinyl alcohol (PVA) and anodized Al2O3 layers were used as bi-layer gate for the fabrication of cobalt phthalocyanine (CoPc) wire base field-effect transistors (OFETs). CoPc wires were grown on SiO2 surfaces by organic vapor phase deposition method. These devices exhibit a field-effect carrier mobility (μEF) value of 1.11 cm2/Vs. The high carrier mobility for CoPc molecules is attributed to the better capacitive coupling between the channel of CoPc wires and the gate through organic-inorganic dielectric layer. Our measurements also demonstrated the way to determine the thicknesses of the dielectric layers for a better process condition of OFETs.http://dx.doi.org/10.1063/1.4834355 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Murali Gedda Nimmakayala V. V. Subbarao Sk. Md. Obaidulla Dipak K. Goswami |
spellingShingle |
Murali Gedda Nimmakayala V. V. Subbarao Sk. Md. Obaidulla Dipak K. Goswami High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric AIP Advances |
author_facet |
Murali Gedda Nimmakayala V. V. Subbarao Sk. Md. Obaidulla Dipak K. Goswami |
author_sort |
Murali Gedda |
title |
High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric |
title_short |
High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric |
title_full |
High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric |
title_fullStr |
High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric |
title_full_unstemmed |
High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric |
title_sort |
high carrier mobility of copc wires based field-effect transistors using bi-layer gate dielectric |
publisher |
AIP Publishing LLC |
series |
AIP Advances |
issn |
2158-3226 |
publishDate |
2013-11-01 |
description |
Polyvinyl alcohol (PVA) and anodized Al2O3 layers were used as bi-layer gate for the fabrication of cobalt phthalocyanine (CoPc) wire base field-effect transistors (OFETs). CoPc wires were grown on SiO2 surfaces by organic vapor phase deposition method. These devices exhibit a field-effect carrier mobility (μEF) value of 1.11 cm2/Vs. The high carrier mobility for CoPc molecules is attributed to the better capacitive coupling between the channel of CoPc wires and the gate through organic-inorganic dielectric layer. Our measurements also demonstrated the way to determine the thicknesses of the dielectric layers for a better process condition of OFETs. |
url |
http://dx.doi.org/10.1063/1.4834355 |
work_keys_str_mv |
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