High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric

Polyvinyl alcohol (PVA) and anodized Al2O3 layers were used as bi-layer gate for the fabrication of cobalt phthalocyanine (CoPc) wire base field-effect transistors (OFETs). CoPc wires were grown on SiO2 surfaces by organic vapor phase deposition method. These devices exhibit a field-effect carrier m...

Full description

Bibliographic Details
Main Authors: Murali Gedda, Nimmakayala V. V. Subbarao, Sk. Md. Obaidulla, Dipak K. Goswami
Format: Article
Language:English
Published: AIP Publishing LLC 2013-11-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4834355
id doaj-3794f5c0b36c498c98408935ffd8e202
record_format Article
spelling doaj-3794f5c0b36c498c98408935ffd8e2022020-11-24T21:17:49ZengAIP Publishing LLCAIP Advances2158-32262013-11-01311112123112123-710.1063/1.4834355022311ADVHigh carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectricMurali Gedda0Nimmakayala V. V. Subbarao1Sk. Md. Obaidulla2Dipak K. Goswami3Department of Physics, Indian Institute of Technology Guwahati, Guwahati-781039, IndiaCentre for Nano Technology, Indian Institute of Technology Guwahati, Guwahati-781039, IndiaDepartment of Physics, Indian Institute of Technology Guwahati, Guwahati-781039, IndiaDepartment of Physics, Indian Institute of Technology Guwahati, Guwahati-781039, IndiaPolyvinyl alcohol (PVA) and anodized Al2O3 layers were used as bi-layer gate for the fabrication of cobalt phthalocyanine (CoPc) wire base field-effect transistors (OFETs). CoPc wires were grown on SiO2 surfaces by organic vapor phase deposition method. These devices exhibit a field-effect carrier mobility (μEF) value of 1.11 cm2/Vs. The high carrier mobility for CoPc molecules is attributed to the better capacitive coupling between the channel of CoPc wires and the gate through organic-inorganic dielectric layer. Our measurements also demonstrated the way to determine the thicknesses of the dielectric layers for a better process condition of OFETs.http://dx.doi.org/10.1063/1.4834355
collection DOAJ
language English
format Article
sources DOAJ
author Murali Gedda
Nimmakayala V. V. Subbarao
Sk. Md. Obaidulla
Dipak K. Goswami
spellingShingle Murali Gedda
Nimmakayala V. V. Subbarao
Sk. Md. Obaidulla
Dipak K. Goswami
High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric
AIP Advances
author_facet Murali Gedda
Nimmakayala V. V. Subbarao
Sk. Md. Obaidulla
Dipak K. Goswami
author_sort Murali Gedda
title High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric
title_short High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric
title_full High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric
title_fullStr High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric
title_full_unstemmed High carrier mobility of CoPc wires based field-effect transistors using bi-layer gate dielectric
title_sort high carrier mobility of copc wires based field-effect transistors using bi-layer gate dielectric
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2013-11-01
description Polyvinyl alcohol (PVA) and anodized Al2O3 layers were used as bi-layer gate for the fabrication of cobalt phthalocyanine (CoPc) wire base field-effect transistors (OFETs). CoPc wires were grown on SiO2 surfaces by organic vapor phase deposition method. These devices exhibit a field-effect carrier mobility (μEF) value of 1.11 cm2/Vs. The high carrier mobility for CoPc molecules is attributed to the better capacitive coupling between the channel of CoPc wires and the gate through organic-inorganic dielectric layer. Our measurements also demonstrated the way to determine the thicknesses of the dielectric layers for a better process condition of OFETs.
url http://dx.doi.org/10.1063/1.4834355
work_keys_str_mv AT muraligedda highcarriermobilityofcopcwiresbasedfieldeffecttransistorsusingbilayergatedielectric
AT nimmakayalavvsubbarao highcarriermobilityofcopcwiresbasedfieldeffecttransistorsusingbilayergatedielectric
AT skmdobaidulla highcarriermobilityofcopcwiresbasedfieldeffecttransistorsusingbilayergatedielectric
AT dipakkgoswami highcarriermobilityofcopcwiresbasedfieldeffecttransistorsusingbilayergatedielectric
_version_ 1726011878293897216