See laser testing at different temperatures

The main problem for laser SEE testing at different temperatures is to determine correlation between laser pulse energy and LET. In the first approximation, LET values with the same laser pulse energy and different temperatures are directly proportional to the absorption coefficient of laser light i...

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Main Authors: Alexander Anatolievich Novikov, Aleksandr Aleksandrovich Pechenkin, Aleksandr Innokent’evich Chumakov, Alexey Olegovich Akhmetov, Oleg Borisovich Mavritskii
Format: Article
Language:English
Published: Moscow Engineering Physics Institute 2016-10-01
Series:Bezopasnostʹ Informacionnyh Tehnologij
Subjects:
Online Access:https://bit.mephi.ru/index.php/bit/article/view/18
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spelling doaj-379056bb60634ae7a1c69a3f719249662020-11-25T00:13:08ZengMoscow Engineering Physics Institute Bezopasnostʹ Informacionnyh Tehnologij2074-71282074-71362016-10-01233556018See laser testing at different temperaturesAlexander Anatolievich Novikov0Aleksandr Aleksandrovich Pechenkin1Aleksandr Innokent’evich Chumakov2Alexey Olegovich Akhmetov3Oleg Borisovich Mavritskii4National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)The main problem for laser SEE testing at different temperatures is to determine correlation between laser pulse energy and LET. In the first approximation, LET values with the same laser pulse energy and different temperatures are directly proportional to the absorption coefficient of laser light in a semiconductor. Use of tabulated values could lead to errors and absorption coefficient should be determined for each sensitive volume of device under test (DUT). Temperature dependence of absorption coefficient could be determined using ionization response of DUT in power supply circuit under local laser irradiation. Using this approach a satisfactory correlation of ion and laser SEE test result was observed.https://bit.mephi.ru/index.php/bit/article/view/18single event effectslaser techniquetemperature dependence
collection DOAJ
language English
format Article
sources DOAJ
author Alexander Anatolievich Novikov
Aleksandr Aleksandrovich Pechenkin
Aleksandr Innokent’evich Chumakov
Alexey Olegovich Akhmetov
Oleg Borisovich Mavritskii
spellingShingle Alexander Anatolievich Novikov
Aleksandr Aleksandrovich Pechenkin
Aleksandr Innokent’evich Chumakov
Alexey Olegovich Akhmetov
Oleg Borisovich Mavritskii
See laser testing at different temperatures
Bezopasnostʹ Informacionnyh Tehnologij
single event effects
laser technique
temperature dependence
author_facet Alexander Anatolievich Novikov
Aleksandr Aleksandrovich Pechenkin
Aleksandr Innokent’evich Chumakov
Alexey Olegovich Akhmetov
Oleg Borisovich Mavritskii
author_sort Alexander Anatolievich Novikov
title See laser testing at different temperatures
title_short See laser testing at different temperatures
title_full See laser testing at different temperatures
title_fullStr See laser testing at different temperatures
title_full_unstemmed See laser testing at different temperatures
title_sort see laser testing at different temperatures
publisher Moscow Engineering Physics Institute
series Bezopasnostʹ Informacionnyh Tehnologij
issn 2074-7128
2074-7136
publishDate 2016-10-01
description The main problem for laser SEE testing at different temperatures is to determine correlation between laser pulse energy and LET. In the first approximation, LET values with the same laser pulse energy and different temperatures are directly proportional to the absorption coefficient of laser light in a semiconductor. Use of tabulated values could lead to errors and absorption coefficient should be determined for each sensitive volume of device under test (DUT). Temperature dependence of absorption coefficient could be determined using ionization response of DUT in power supply circuit under local laser irradiation. Using this approach a satisfactory correlation of ion and laser SEE test result was observed.
topic single event effects
laser technique
temperature dependence
url https://bit.mephi.ru/index.php/bit/article/view/18
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AT alexeyolegovichakhmetov seelasertestingatdifferenttemperatures
AT olegborisovichmavritskii seelasertestingatdifferenttemperatures
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