See laser testing at different temperatures
The main problem for laser SEE testing at different temperatures is to determine correlation between laser pulse energy and LET. In the first approximation, LET values with the same laser pulse energy and different temperatures are directly proportional to the absorption coefficient of laser light i...
Main Authors: | , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
Moscow Engineering Physics Institute
2016-10-01
|
Series: | Bezopasnostʹ Informacionnyh Tehnologij |
Subjects: | |
Online Access: | https://bit.mephi.ru/index.php/bit/article/view/18 |
id |
doaj-379056bb60634ae7a1c69a3f71924966 |
---|---|
record_format |
Article |
spelling |
doaj-379056bb60634ae7a1c69a3f719249662020-11-25T00:13:08ZengMoscow Engineering Physics Institute Bezopasnostʹ Informacionnyh Tehnologij2074-71282074-71362016-10-01233556018See laser testing at different temperaturesAlexander Anatolievich Novikov0Aleksandr Aleksandrovich Pechenkin1Aleksandr Innokent’evich Chumakov2Alexey Olegovich Akhmetov3Oleg Borisovich Mavritskii4National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)The main problem for laser SEE testing at different temperatures is to determine correlation between laser pulse energy and LET. In the first approximation, LET values with the same laser pulse energy and different temperatures are directly proportional to the absorption coefficient of laser light in a semiconductor. Use of tabulated values could lead to errors and absorption coefficient should be determined for each sensitive volume of device under test (DUT). Temperature dependence of absorption coefficient could be determined using ionization response of DUT in power supply circuit under local laser irradiation. Using this approach a satisfactory correlation of ion and laser SEE test result was observed.https://bit.mephi.ru/index.php/bit/article/view/18single event effectslaser techniquetemperature dependence |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Alexander Anatolievich Novikov Aleksandr Aleksandrovich Pechenkin Aleksandr Innokent’evich Chumakov Alexey Olegovich Akhmetov Oleg Borisovich Mavritskii |
spellingShingle |
Alexander Anatolievich Novikov Aleksandr Aleksandrovich Pechenkin Aleksandr Innokent’evich Chumakov Alexey Olegovich Akhmetov Oleg Borisovich Mavritskii See laser testing at different temperatures Bezopasnostʹ Informacionnyh Tehnologij single event effects laser technique temperature dependence |
author_facet |
Alexander Anatolievich Novikov Aleksandr Aleksandrovich Pechenkin Aleksandr Innokent’evich Chumakov Alexey Olegovich Akhmetov Oleg Borisovich Mavritskii |
author_sort |
Alexander Anatolievich Novikov |
title |
See laser testing at different temperatures |
title_short |
See laser testing at different temperatures |
title_full |
See laser testing at different temperatures |
title_fullStr |
See laser testing at different temperatures |
title_full_unstemmed |
See laser testing at different temperatures |
title_sort |
see laser testing at different temperatures |
publisher |
Moscow Engineering Physics Institute |
series |
Bezopasnostʹ Informacionnyh Tehnologij |
issn |
2074-7128 2074-7136 |
publishDate |
2016-10-01 |
description |
The main problem for laser SEE testing at different temperatures is to determine correlation between laser pulse energy and LET. In the first approximation, LET values with the same laser pulse energy and different temperatures are directly proportional to the absorption coefficient of laser light in a semiconductor. Use of tabulated values could lead to errors and absorption coefficient should be determined for each sensitive volume of device under test (DUT). Temperature dependence of absorption coefficient could be determined using ionization response of DUT in power supply circuit under local laser irradiation. Using this approach a satisfactory correlation of ion and laser SEE test result was observed. |
topic |
single event effects laser technique temperature dependence |
url |
https://bit.mephi.ru/index.php/bit/article/view/18 |
work_keys_str_mv |
AT alexanderanatolievichnovikov seelasertestingatdifferenttemperatures AT aleksandraleksandrovichpechenkin seelasertestingatdifferenttemperatures AT aleksandrinnokentevichchumakov seelasertestingatdifferenttemperatures AT alexeyolegovichakhmetov seelasertestingatdifferenttemperatures AT olegborisovichmavritskii seelasertestingatdifferenttemperatures |
_version_ |
1725396241729191936 |