See laser testing at different temperatures

• Main Authors: Alexander Anatolievich Novikov, Aleksandr Aleksandrovich Pechenkin, Aleksandr Innokent’evich Chumakov, Alexey Olegovich Akhmetov, Oleg Borisovich Mavritskii
• Format: Article
• Language: English
• Published: Moscow Engineering Physics Institute 2016-10-01
• Series: Bezopasnostʹ Informacionnyh Tehnologij
• Subjects: single event effects; laser technique; temperature dependence
• Online Access: https://bit.mephi.ru/index.php/bit/article/view/18
• ISSN: 2074-7128; 2074-7136

The main problem for laser SEE testing at different temperatures is to determine correlation between laser pulse energy and LET. In the first approximation, LET values with the same laser pulse energy and different temperatures are directly proportional to the absorption coefficient of laser light in a semiconductor. Use of tabulated values could lead to errors and absorption coefficient should be determined for each sensitive volume of device under test (DUT). Temperature dependence of absorption coefficient could be determined using ionization response of DUT in power supply circuit under local laser irradiation. Using this approach a satisfactory correlation of ion and laser SEE test result was observed.