Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser

Research on ultrathin quantum materials requires full control of the growth and surface quality of the specimens in order to perform experiments on their atomic structure and electron states leading to ultimate analysis of their intrinsic properties. We report results on epitaxial FeSe thin films gr...

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Main Authors: Sandeep Kumar Chaluvadi, Debashis Mondal, Chiara Bigi, Jun Fujii, Rajdeep Adhikari, Regina Ciancio, Alberta Bonanni, Giancarlo Panaccione, Giorgio Rossi, Ivana Vobornik, Pasquale Orgiani
Format: Article
Language:English
Published: MDPI AG 2021-02-01
Series:Coatings
Subjects:
Online Access:https://www.mdpi.com/2079-6412/11/3/276
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spelling doaj-3718cff3020b43b8b38d94107f1084ff2021-02-27T00:05:23ZengMDPI AGCoatings2079-64122021-02-011127627610.3390/coatings11030276Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG LaserSandeep Kumar Chaluvadi0Debashis Mondal1Chiara Bigi2Jun Fujii3Rajdeep Adhikari4Regina Ciancio5Alberta Bonanni6Giancarlo Panaccione7Giorgio Rossi8Ivana Vobornik9Pasquale Orgiani10CNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyInstitute of Semiconductors and Solid-State Physics, Johannes Kepler University, 69 Altenbergerstrasse, 4040 Linz, AustriaCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyInstitute of Semiconductors and Solid-State Physics, Johannes Kepler University, 69 Altenbergerstrasse, 4040 Linz, AustriaCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyResearch on ultrathin quantum materials requires full control of the growth and surface quality of the specimens in order to perform experiments on their atomic structure and electron states leading to ultimate analysis of their intrinsic properties. We report results on epitaxial FeSe thin films grown by pulsed laser deposition (PLD) on CaF<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msub><mrow></mrow><mn>2</mn></msub></semantics></math></inline-formula> (001) substrates as obtained by exploiting the advantages of an all-in-situ ultra-high vacuum (UHV) laboratory allowing for direct high-resolution surface analysis by scanning tunnelling microscopy (STM), synchrotron radiation X-ray photoelectron spectroscopy (XPS) and angle-resolved photoemission spectroscopy (ARPES) on fresh surfaces. FeSe PLD growth protocols were fine-tuned by optimizing target-to-substrate distance <i>d</i> and ablation frequency, atomically flat terraces with unit-cell step heights are obtained, overcoming the spiral morphology often observed by others. In-situ ARPES with linearly polarized horizontal and vertical radiation shows hole-like and electron-like pockets at the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>Γ</mi></semantics></math></inline-formula> and M points of the Fermi surface, consistent with previous observations on cleaved single crystal surfaces. The control achieved in growing quantum materials with volatile elements such as Se by in-situ PLD makes it possible to address the fine analysis of the surfaces by in-situ ARPES and XPS. The study opens wide avenues for the PLD based heterostructures as work-bench for the understanding of proximity-driven effects and for the development of prospective devices based on combinations of quantum materials.https://www.mdpi.com/2079-6412/11/3/276FeSepulsed laser depositionscanning tunneling microscopyangle-resolved photoemission spectroscopy
collection DOAJ
language English
format Article
sources DOAJ
author Sandeep Kumar Chaluvadi
Debashis Mondal
Chiara Bigi
Jun Fujii
Rajdeep Adhikari
Regina Ciancio
Alberta Bonanni
Giancarlo Panaccione
Giorgio Rossi
Ivana Vobornik
Pasquale Orgiani
spellingShingle Sandeep Kumar Chaluvadi
Debashis Mondal
Chiara Bigi
Jun Fujii
Rajdeep Adhikari
Regina Ciancio
Alberta Bonanni
Giancarlo Panaccione
Giorgio Rossi
Ivana Vobornik
Pasquale Orgiani
Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser
Coatings
FeSe
pulsed laser deposition
scanning tunneling microscopy
angle-resolved photoemission spectroscopy
author_facet Sandeep Kumar Chaluvadi
Debashis Mondal
Chiara Bigi
Jun Fujii
Rajdeep Adhikari
Regina Ciancio
Alberta Bonanni
Giancarlo Panaccione
Giorgio Rossi
Ivana Vobornik
Pasquale Orgiani
author_sort Sandeep Kumar Chaluvadi
title Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser
title_short Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser
title_full Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser
title_fullStr Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser
title_full_unstemmed Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser
title_sort direct-arpes and stm investigation of fese thin film growth by nd:yag laser
publisher MDPI AG
series Coatings
issn 2079-6412
publishDate 2021-02-01
description Research on ultrathin quantum materials requires full control of the growth and surface quality of the specimens in order to perform experiments on their atomic structure and electron states leading to ultimate analysis of their intrinsic properties. We report results on epitaxial FeSe thin films grown by pulsed laser deposition (PLD) on CaF<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msub><mrow></mrow><mn>2</mn></msub></semantics></math></inline-formula> (001) substrates as obtained by exploiting the advantages of an all-in-situ ultra-high vacuum (UHV) laboratory allowing for direct high-resolution surface analysis by scanning tunnelling microscopy (STM), synchrotron radiation X-ray photoelectron spectroscopy (XPS) and angle-resolved photoemission spectroscopy (ARPES) on fresh surfaces. FeSe PLD growth protocols were fine-tuned by optimizing target-to-substrate distance <i>d</i> and ablation frequency, atomically flat terraces with unit-cell step heights are obtained, overcoming the spiral morphology often observed by others. In-situ ARPES with linearly polarized horizontal and vertical radiation shows hole-like and electron-like pockets at the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>Γ</mi></semantics></math></inline-formula> and M points of the Fermi surface, consistent with previous observations on cleaved single crystal surfaces. The control achieved in growing quantum materials with volatile elements such as Se by in-situ PLD makes it possible to address the fine analysis of the surfaces by in-situ ARPES and XPS. The study opens wide avenues for the PLD based heterostructures as work-bench for the understanding of proximity-driven effects and for the development of prospective devices based on combinations of quantum materials.
topic FeSe
pulsed laser deposition
scanning tunneling microscopy
angle-resolved photoemission spectroscopy
url https://www.mdpi.com/2079-6412/11/3/276
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