Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser
Research on ultrathin quantum materials requires full control of the growth and surface quality of the specimens in order to perform experiments on their atomic structure and electron states leading to ultimate analysis of their intrinsic properties. We report results on epitaxial FeSe thin films gr...
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doaj-3718cff3020b43b8b38d94107f1084ff2021-02-27T00:05:23ZengMDPI AGCoatings2079-64122021-02-011127627610.3390/coatings11030276Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG LaserSandeep Kumar Chaluvadi0Debashis Mondal1Chiara Bigi2Jun Fujii3Rajdeep Adhikari4Regina Ciancio5Alberta Bonanni6Giancarlo Panaccione7Giorgio Rossi8Ivana Vobornik9Pasquale Orgiani10CNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyInstitute of Semiconductors and Solid-State Physics, Johannes Kepler University, 69 Altenbergerstrasse, 4040 Linz, AustriaCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyInstitute of Semiconductors and Solid-State Physics, Johannes Kepler University, 69 Altenbergerstrasse, 4040 Linz, AustriaCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyCNR-IOM, TASC Laboratory in Area Science Park, 34139 Trieste, ItalyResearch on ultrathin quantum materials requires full control of the growth and surface quality of the specimens in order to perform experiments on their atomic structure and electron states leading to ultimate analysis of their intrinsic properties. We report results on epitaxial FeSe thin films grown by pulsed laser deposition (PLD) on CaF<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msub><mrow></mrow><mn>2</mn></msub></semantics></math></inline-formula> (001) substrates as obtained by exploiting the advantages of an all-in-situ ultra-high vacuum (UHV) laboratory allowing for direct high-resolution surface analysis by scanning tunnelling microscopy (STM), synchrotron radiation X-ray photoelectron spectroscopy (XPS) and angle-resolved photoemission spectroscopy (ARPES) on fresh surfaces. FeSe PLD growth protocols were fine-tuned by optimizing target-to-substrate distance <i>d</i> and ablation frequency, atomically flat terraces with unit-cell step heights are obtained, overcoming the spiral morphology often observed by others. In-situ ARPES with linearly polarized horizontal and vertical radiation shows hole-like and electron-like pockets at the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>Γ</mi></semantics></math></inline-formula> and M points of the Fermi surface, consistent with previous observations on cleaved single crystal surfaces. The control achieved in growing quantum materials with volatile elements such as Se by in-situ PLD makes it possible to address the fine analysis of the surfaces by in-situ ARPES and XPS. The study opens wide avenues for the PLD based heterostructures as work-bench for the understanding of proximity-driven effects and for the development of prospective devices based on combinations of quantum materials.https://www.mdpi.com/2079-6412/11/3/276FeSepulsed laser depositionscanning tunneling microscopyangle-resolved photoemission spectroscopy |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Sandeep Kumar Chaluvadi Debashis Mondal Chiara Bigi Jun Fujii Rajdeep Adhikari Regina Ciancio Alberta Bonanni Giancarlo Panaccione Giorgio Rossi Ivana Vobornik Pasquale Orgiani |
spellingShingle |
Sandeep Kumar Chaluvadi Debashis Mondal Chiara Bigi Jun Fujii Rajdeep Adhikari Regina Ciancio Alberta Bonanni Giancarlo Panaccione Giorgio Rossi Ivana Vobornik Pasquale Orgiani Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser Coatings FeSe pulsed laser deposition scanning tunneling microscopy angle-resolved photoemission spectroscopy |
author_facet |
Sandeep Kumar Chaluvadi Debashis Mondal Chiara Bigi Jun Fujii Rajdeep Adhikari Regina Ciancio Alberta Bonanni Giancarlo Panaccione Giorgio Rossi Ivana Vobornik Pasquale Orgiani |
author_sort |
Sandeep Kumar Chaluvadi |
title |
Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser |
title_short |
Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser |
title_full |
Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser |
title_fullStr |
Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser |
title_full_unstemmed |
Direct-ARPES and STM Investigation of FeSe Thin Film Growth by Nd:YAG Laser |
title_sort |
direct-arpes and stm investigation of fese thin film growth by nd:yag laser |
publisher |
MDPI AG |
series |
Coatings |
issn |
2079-6412 |
publishDate |
2021-02-01 |
description |
Research on ultrathin quantum materials requires full control of the growth and surface quality of the specimens in order to perform experiments on their atomic structure and electron states leading to ultimate analysis of their intrinsic properties. We report results on epitaxial FeSe thin films grown by pulsed laser deposition (PLD) on CaF<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msub><mrow></mrow><mn>2</mn></msub></semantics></math></inline-formula> (001) substrates as obtained by exploiting the advantages of an all-in-situ ultra-high vacuum (UHV) laboratory allowing for direct high-resolution surface analysis by scanning tunnelling microscopy (STM), synchrotron radiation X-ray photoelectron spectroscopy (XPS) and angle-resolved photoemission spectroscopy (ARPES) on fresh surfaces. FeSe PLD growth protocols were fine-tuned by optimizing target-to-substrate distance <i>d</i> and ablation frequency, atomically flat terraces with unit-cell step heights are obtained, overcoming the spiral morphology often observed by others. In-situ ARPES with linearly polarized horizontal and vertical radiation shows hole-like and electron-like pockets at the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>Γ</mi></semantics></math></inline-formula> and M points of the Fermi surface, consistent with previous observations on cleaved single crystal surfaces. The control achieved in growing quantum materials with volatile elements such as Se by in-situ PLD makes it possible to address the fine analysis of the surfaces by in-situ ARPES and XPS. The study opens wide avenues for the PLD based heterostructures as work-bench for the understanding of proximity-driven effects and for the development of prospective devices based on combinations of quantum materials. |
topic |
FeSe pulsed laser deposition scanning tunneling microscopy angle-resolved photoemission spectroscopy |
url |
https://www.mdpi.com/2079-6412/11/3/276 |
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