Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS Device
The Si-rich metal -oxide-nitride-oxide-silicon (hereafter Si-MONOS) can be candidates for non-volatile total ionization dose (TID) radiation sensors. In the case of Si-MONOS gamma radiation sensors, the gamma radiation induces a significant decrease of threshold voltage VT. The change of VT for Si-M...
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2016-01-01
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Online Access: | http://dx.doi.org/10.1051/matecconf/20167105007 |
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doaj-35bab7429c564169837e2dd81d921f142021-04-02T09:59:15ZengEDP SciencesMATEC Web of Conferences2261-236X2016-01-01710500710.1051/matecconf/20167105007matecconf_ccpe2016_05007Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS DeviceHsieh Wen-Ching0Daniel Lee Hao-Tien1Jon Fuh-Cheng2Wu Shich-Chuan3Heh Dawei4Tsai Tzu-I5Minghsin Universuty of Science and TechnologyTreasure Giant Technology Inc.Southern Taiwan University of Science and TechnologyNational Nano Device LaboratoriesTaiwan Semiconductor Manufacturing Company LimitedUnited Microelectronics CorporationThe Si-rich metal -oxide-nitride-oxide-silicon (hereafter Si-MONOS) can be candidates for non-volatile total ionization dose (TID) radiation sensors. In the case of Si-MONOS gamma radiation sensors, the gamma radiation induces a significant decrease of threshold voltage VT. The change of VT for Si-MONOS after gamma irradiation has a strong correlation to the TID of gamma ray exposure as well. The Si-MONOS capacitor device in this study has demonstrated the better feasibility for non-volatile TID radiation sensing in the future.http://dx.doi.org/10.1051/matecconf/20167105007 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Hsieh Wen-Ching Daniel Lee Hao-Tien Jon Fuh-Cheng Wu Shich-Chuan Heh Dawei Tsai Tzu-I |
spellingShingle |
Hsieh Wen-Ching Daniel Lee Hao-Tien Jon Fuh-Cheng Wu Shich-Chuan Heh Dawei Tsai Tzu-I Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS Device MATEC Web of Conferences |
author_facet |
Hsieh Wen-Ching Daniel Lee Hao-Tien Jon Fuh-Cheng Wu Shich-Chuan Heh Dawei Tsai Tzu-I |
author_sort |
Hsieh Wen-Ching |
title |
Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS Device |
title_short |
Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS Device |
title_full |
Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS Device |
title_fullStr |
Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS Device |
title_full_unstemmed |
Total Ionization Radiation Sensor Performance Improvement by Using Si-rich MONOS Device |
title_sort |
total ionization radiation sensor performance improvement by using si-rich monos device |
publisher |
EDP Sciences |
series |
MATEC Web of Conferences |
issn |
2261-236X |
publishDate |
2016-01-01 |
description |
The Si-rich metal -oxide-nitride-oxide-silicon (hereafter Si-MONOS) can be candidates for non-volatile total ionization dose (TID) radiation sensors. In the case of Si-MONOS gamma radiation sensors, the gamma radiation induces a significant decrease of threshold voltage VT. The change of VT for Si-MONOS after gamma irradiation has a strong correlation to the TID of gamma ray exposure as well. The Si-MONOS capacitor device in this study has demonstrated the better feasibility for non-volatile TID radiation sensing in the future. |
url |
http://dx.doi.org/10.1051/matecconf/20167105007 |
work_keys_str_mv |
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1724168176654090240 |