Effect of Ultrasound on the Oxidative Copper Leaching from Chalcopyrite in Acidic Ferric Sulfate Media

The objective of this study is to compare the reaction kinetics of copper leaching from chalcopyrite in acidic ferric sulfate media with (UAL) and without (non-UAL) ultrasound assistance. Four leaching parameters were evaluated and optimized. The parameter with the strongest effect was temperature,...

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Bibliographic Details
Main Authors: Jingxiu Wang, Fariborz Faraji, Ahmad Ghahreman
Format: Article
Language:English
Published: MDPI AG 2020-07-01
Series:Minerals
Subjects:
Online Access:https://www.mdpi.com/2075-163X/10/7/633
Description
Summary:The objective of this study is to compare the reaction kinetics of copper leaching from chalcopyrite in acidic ferric sulfate media with (UAL) and without (non-UAL) ultrasound assistance. Four leaching parameters were evaluated and optimized. The parameter with the strongest effect was temperature, followed by ultrasonic power, the solid-to-liquid ratio (S/L), and acid concentration. Copper recovery showed an increase with rising temperatures in both systems. Ultrasonic power had a positive effect on copper leaching, but no significant difference was found among various power amplitudes. Copper extraction increased with decreasing S/L. At 0.1% S/L, the UAL leaching rate was double the non-UAL leaching rate. In both systems, acid concentration had little effect on copper extraction. Under optimized conditions, 20% amplitude power, 1% S/L, 0.5 M acid, and 80 °C leaching temperature, copper extraction was 50.4% and 57.5% in the non-UAL and UAL treatments, respectively. Ultrasonic waves enhanced the leaching rate, shortened the reaction time, and reduced acid consumption. Analysis of the rate-controlling step using a shrinking core model showed that leaching occurs after diffusion through the product layer but also chemical controlled in both non-UAL and UAL systems. The leaching mechanism was confirmed by characterizing the chalcopyrite and leached residue with X-ray diffraction and scanning electron microscopy/energy dispersive X-ray spectroscopy.
ISSN:2075-163X