Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface

Real-time optical reflection of incident p-polarized light near Brewster’s angle shows that after drop-casting iron oxide nanoparticles (NPs) in heptane on top of a diethylene glycol (DEG) liquid substrate, an iron oxide NP layer forms at the DEG/heptane interface, and it self-limits to a monolayer...

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Main Authors: Jiayang Hu, Brady Pan, Takuma Makihara, Roy D. J. Garcia, Irving P. Herman
Format: Article
Language:English
Published: AIP Publishing LLC 2019-06-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5099487
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spelling doaj-3531c123408a40ff978504a29b263ba62020-11-24T21:21:54ZengAIP Publishing LLCAIP Advances2158-32262019-06-0196065022065022-610.1063/1.5099487076906ADVBrewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interfaceJiayang Hu0Brady Pan1Takuma Makihara2Roy D. J. Garcia3Irving P. Herman4Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USADepartment of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USADepartment of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USADepartment of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USADepartment of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USAReal-time optical reflection of incident p-polarized light near Brewster’s angle shows that after drop-casting iron oxide nanoparticles (NPs) in heptane on top of a diethylene glycol (DEG) liquid substrate, an iron oxide NP layer forms at the DEG/heptane interface, and it self-limits to a monolayer even when there are excess NPs dispersed in the upper heptane phase. Most modes of NP self-assembly do not self-limit growth after the formation of a single monolayer. Observations are compared to a reflection model incorporating the reflectances expected at each interface. An effective medium model of the dielectric constant is used to model the reflectance of the NP layer at the DEG/heptane interface.http://dx.doi.org/10.1063/1.5099487
collection DOAJ
language English
format Article
sources DOAJ
author Jiayang Hu
Brady Pan
Takuma Makihara
Roy D. J. Garcia
Irving P. Herman
spellingShingle Jiayang Hu
Brady Pan
Takuma Makihara
Roy D. J. Garcia
Irving P. Herman
Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface
AIP Advances
author_facet Jiayang Hu
Brady Pan
Takuma Makihara
Roy D. J. Garcia
Irving P. Herman
author_sort Jiayang Hu
title Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface
title_short Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface
title_full Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface
title_fullStr Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface
title_full_unstemmed Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface
title_sort brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2019-06-01
description Real-time optical reflection of incident p-polarized light near Brewster’s angle shows that after drop-casting iron oxide nanoparticles (NPs) in heptane on top of a diethylene glycol (DEG) liquid substrate, an iron oxide NP layer forms at the DEG/heptane interface, and it self-limits to a monolayer even when there are excess NPs dispersed in the upper heptane phase. Most modes of NP self-assembly do not self-limit growth after the formation of a single monolayer. Observations are compared to a reflection model incorporating the reflectances expected at each interface. An effective medium model of the dielectric constant is used to model the reflectance of the NP layer at the DEG/heptane interface.
url http://dx.doi.org/10.1063/1.5099487
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