Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface
Real-time optical reflection of incident p-polarized light near Brewster’s angle shows that after drop-casting iron oxide nanoparticles (NPs) in heptane on top of a diethylene glycol (DEG) liquid substrate, an iron oxide NP layer forms at the DEG/heptane interface, and it self-limits to a monolayer...
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2019-06-01
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Online Access: | http://dx.doi.org/10.1063/1.5099487 |
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doaj-3531c123408a40ff978504a29b263ba62020-11-24T21:21:54ZengAIP Publishing LLCAIP Advances2158-32262019-06-0196065022065022-610.1063/1.5099487076906ADVBrewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interfaceJiayang Hu0Brady Pan1Takuma Makihara2Roy D. J. Garcia3Irving P. Herman4Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USADepartment of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USADepartment of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USADepartment of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USADepartment of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USAReal-time optical reflection of incident p-polarized light near Brewster’s angle shows that after drop-casting iron oxide nanoparticles (NPs) in heptane on top of a diethylene glycol (DEG) liquid substrate, an iron oxide NP layer forms at the DEG/heptane interface, and it self-limits to a monolayer even when there are excess NPs dispersed in the upper heptane phase. Most modes of NP self-assembly do not self-limit growth after the formation of a single monolayer. Observations are compared to a reflection model incorporating the reflectances expected at each interface. An effective medium model of the dielectric constant is used to model the reflectance of the NP layer at the DEG/heptane interface.http://dx.doi.org/10.1063/1.5099487 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Jiayang Hu Brady Pan Takuma Makihara Roy D. J. Garcia Irving P. Herman |
spellingShingle |
Jiayang Hu Brady Pan Takuma Makihara Roy D. J. Garcia Irving P. Herman Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface AIP Advances |
author_facet |
Jiayang Hu Brady Pan Takuma Makihara Roy D. J. Garcia Irving P. Herman |
author_sort |
Jiayang Hu |
title |
Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface |
title_short |
Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface |
title_full |
Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface |
title_fullStr |
Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface |
title_full_unstemmed |
Brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface |
title_sort |
brewster angle optical reflection observation of self-limiting nanoparticle monolayer self-assembly at a liquid/liquid interface |
publisher |
AIP Publishing LLC |
series |
AIP Advances |
issn |
2158-3226 |
publishDate |
2019-06-01 |
description |
Real-time optical reflection of incident p-polarized light near Brewster’s angle shows that after drop-casting iron oxide nanoparticles (NPs) in heptane on top of a diethylene glycol (DEG) liquid substrate, an iron oxide NP layer forms at the DEG/heptane interface, and it self-limits to a monolayer even when there are excess NPs dispersed in the upper heptane phase. Most modes of NP self-assembly do not self-limit growth after the formation of a single monolayer. Observations are compared to a reflection model incorporating the reflectances expected at each interface. An effective medium model of the dielectric constant is used to model the reflectance of the NP layer at the DEG/heptane interface. |
url |
http://dx.doi.org/10.1063/1.5099487 |
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