Sequence Diagram Test Case Specification and Virtual Integration Analysis using Timed-Arc Petri Nets

• Main Authors: Sven Sieverding, Christian Ellen, Peter Battram
• Format: Article
• Language: English
• Published: Open Publishing Association 2013-02-01
• Series: Electronic Proceedings in Theoretical Computer Science
• Online Access: http://arxiv.org/pdf/1302.5170v1

In this paper, we formally define Test Case Sequence Diagrams (TCSD) as an easy-to-use means to specify test cases for components including timing constraints. These test cases are modeled using the UML2 syntax and can be specified by standard UML-modeling-tools. In a component-based design an early identification of errors can be achieved by a virtual integration of components before the actual system is build. We define such a procedure which integrates the individual test cases of the components according to the interconnections of a given architecture and checks if all specified communication sequences are consistent. Therefore, we formally define the transformation of TCSD into timed-arc Petri nets and a process for the combination of these nets. The applicability of our approach is demonstrated on an avionic use case from the ARP4761 standard.