Multi-petahertz electron interference in Cr:Al2O3 solid-state material

Multi-petahertz electron interference in Cr:Al2O3 solid-state material

Signal processing in electronic devices is in the THz regime. Here the authors measure NIR lightwave-field-induced multiple dipole oscillations in Cr:Al2O3 in the time domain reaching PHz scale by using an isolated attosecond pulse and this method shows potential for higher speed signal processing.

Bibliographic Details
Main Authors: Hiroki Mashiko, Yuta Chisuga, Ikufumi Katayama, Katsuya Oguri, Hiroyuki Masuda, Jun Takeda, Hideki Gotoh
Format: Article
Language:English
Published: Nature Publishing Group 2018-04-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-018-03885-7
Description
Summary:Signal processing in electronic devices is in the THz regime. Here the authors measure NIR lightwave-field-induced multiple dipole oscillations in Cr:Al2O3 in the time domain reaching PHz scale by using an isolated attosecond pulse and this method shows potential for higher speed signal processing.
ISSN:2041-1723

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