A Reliability Prediction Methodology for LED Arrays

In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influence...

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Bibliographic Details
Main Authors: Bo Sun, Jiajie Fan, Xuejun Fan, Guoqi Zhang, Guohao Zhang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8600302/

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