A Reliability Prediction Methodology for LED Arrays

• Main Authors: Bo Sun, Jiajie Fan, Xuejun Fan, Guoqi Zhang, Guohao Zhang
• Format: Article
• Language: English
• Published: IEEE 2019-01-01
• Series: IEEE Access
• Subjects: Catastrophic failure; electronic-thermal model; LED array; Markov chain; reliability prediction
• Online Access: https://ieeexplore.ieee.org/document/8600302/

In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A Markov chain-based model is used to calculate the probability distribution of each failure mode, including the lumen decay and catastrophic failure. Two types of LEDs were selected for a numerical study. The proposed prediction method provides the realistic reliability prediction results. It is found that the properties of LEDs have a great impact on their hazard rates of LED arrays. The equivalent resistance, third-order non-radiative coefficient, and radiative coefficient of LEDs are critical to the reliability of an LED array.