Determination of surface parameters for backscattering simulation in the millimeter and centimeter wave regions

• Main Authors: A.V. Bukin, V.G. Gutnik, Yu.F. Lohvinov, N.G. Reznichenko
• Format: Article
• Language: English
• Published: Akademperiodyka 2020-09-01
• Series: Радиофизика и электроника
• Subjects: backscattering; radio wave propagation; surface discretization
• Online Access: http://re-journal.org.ua/sites/default/files/file_attach/2020-3/6.pdf

Subject and Purpose. The article is devoted to the modeling of electromagnetic field backscattering in the millimeter and centimeter wave regions. The relevance of such studies proceeds from the need to have wave scattering characteristics of various objects at the modeling stage. The aim of the work is to determine an acceptable step size of the surface discretization, no matter whether a well-known or perspective method of the scattered field calculation is used. Methods and Methodology. To achieve the goal as defined, mathematical and statistical modeling methods are used. The modeling and theoretical results are compared. Results. Numerical simulations of the electromagnetic field scattering have been performed using the Fresnel-Kirchhoff diffraction formula and the method of surface representation by a set of elementary flat faces. For such simplest objects as a ball and a plane, a comparison of the theoretical and modelling results on effective scattering surface has been performed and made it possible to determine an acceptable step size of the surface discretization in the electromagnetic field backscattering. It has been shown that once the surface discretization has been chosen properly, the determination of the field strength by the Fresnel-Kirchhoff method provides an effective scattering surface value that coincides with the theoretical results most accurately. Conclusion. It has been shown that the Fresnel-Kirchhoff method describes basic properties of the scattered field most well. The employment of the modeling method of surface representation by a set of flat faces with relevant scattering patterns requires a normalization of the results with the relevant theoretical and experimental data taken into account.