Scaling properties of ballistic nano-transistors

<p>Abstract</p> <p>Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated <it>I</it> <sub>D </sub>- <it>V</it> <sub>D</sub&g...

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Bibliographic Details
Main Authors: Wulf Ulrich, Krahlisch Marcus, Richter Hans
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/365

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