Influence of duration time of CVD process on emissive properties of carbon nanotubes films

In this paper various types of films made of carbon nanotubes (CNTs) are presented. These films were prepared on different substrates (Al2O3, Si n-type) by the two-step method. The two-step method consists of physical vapor deposition step, followed by chemical vapor deposition step (PVD/CVD). Param...

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Main Authors: Stępinska Izabela, Kozłowski Mirosław, Radomska Joanna, Wronka Halina, Czerwosz Elżbieta, Sobczak Kamil
Format: Article
Language:English
Published: Sciendo 2015-03-01
Series:Materials Science-Poland
Subjects:
SEM
TEM
Online Access:http://www.degruyter.com/view/j/msp.2015.33.issue-1/msp-2015-0023/msp-2015-0023.xml?format=INT
id doaj-2b0d7fb816d44dc3955fad9143bbecd6
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spelling doaj-2b0d7fb816d44dc3955fad9143bbecd62020-11-24T23:26:38ZengSciendoMaterials Science-Poland2083-134X2015-03-01331364610.1515/msp-2015-0023msp-2015-0023Influence of duration time of CVD process on emissive properties of carbon nanotubes filmsStępinska Izabela0Kozłowski Mirosław1Radomska Joanna2Wronka Halina3Czerwosz Elżbieta4Sobczak Kamil5Tele and Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, PolandTele and Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, PolandTele and Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, PolandTele and Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, PolandTele and Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, PolandInstitute of Physics PASc., al. Lotników 32/46, 02-668 Warsaw, PolandIn this paper various types of films made of carbon nanotubes (CNTs) are presented. These films were prepared on different substrates (Al2O3, Si n-type) by the two-step method. The two-step method consists of physical vapor deposition step, followed by chemical vapor deposition step (PVD/CVD). Parameters of PVD process were the same for all initial films, while the duration times of the second step - the CVD process, were different (15, 30 min.). Prepared films were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and field emission (FE) measurements. The I-E and F-N characteristics of electron emission were discussed in terms of various forms of CNT films. The value of threshold electric field ranged from few V/μm (for CNT dispersed rarely on the surface of the film deposited on Si) up to ~20 V/μm (for Al2O3 substrate).http://www.degruyter.com/view/j/msp.2015.33.issue-1/msp-2015-0023/msp-2015-0023.xml?format=INTcarbon nanotubes filmfield emissionSEMTEM
collection DOAJ
language English
format Article
sources DOAJ
author Stępinska Izabela
Kozłowski Mirosław
Radomska Joanna
Wronka Halina
Czerwosz Elżbieta
Sobczak Kamil
spellingShingle Stępinska Izabela
Kozłowski Mirosław
Radomska Joanna
Wronka Halina
Czerwosz Elżbieta
Sobczak Kamil
Influence of duration time of CVD process on emissive properties of carbon nanotubes films
Materials Science-Poland
carbon nanotubes film
field emission
SEM
TEM
author_facet Stępinska Izabela
Kozłowski Mirosław
Radomska Joanna
Wronka Halina
Czerwosz Elżbieta
Sobczak Kamil
author_sort Stępinska Izabela
title Influence of duration time of CVD process on emissive properties of carbon nanotubes films
title_short Influence of duration time of CVD process on emissive properties of carbon nanotubes films
title_full Influence of duration time of CVD process on emissive properties of carbon nanotubes films
title_fullStr Influence of duration time of CVD process on emissive properties of carbon nanotubes films
title_full_unstemmed Influence of duration time of CVD process on emissive properties of carbon nanotubes films
title_sort influence of duration time of cvd process on emissive properties of carbon nanotubes films
publisher Sciendo
series Materials Science-Poland
issn 2083-134X
publishDate 2015-03-01
description In this paper various types of films made of carbon nanotubes (CNTs) are presented. These films were prepared on different substrates (Al2O3, Si n-type) by the two-step method. The two-step method consists of physical vapor deposition step, followed by chemical vapor deposition step (PVD/CVD). Parameters of PVD process were the same for all initial films, while the duration times of the second step - the CVD process, were different (15, 30 min.). Prepared films were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and field emission (FE) measurements. The I-E and F-N characteristics of electron emission were discussed in terms of various forms of CNT films. The value of threshold electric field ranged from few V/μm (for CNT dispersed rarely on the surface of the film deposited on Si) up to ~20 V/μm (for Al2O3 substrate).
topic carbon nanotubes film
field emission
SEM
TEM
url http://www.degruyter.com/view/j/msp.2015.33.issue-1/msp-2015-0023/msp-2015-0023.xml?format=INT
work_keys_str_mv AT stepinskaizabela influenceofdurationtimeofcvdprocessonemissivepropertiesofcarbonnanotubesfilms
AT kozłowskimirosław influenceofdurationtimeofcvdprocessonemissivepropertiesofcarbonnanotubesfilms
AT radomskajoanna influenceofdurationtimeofcvdprocessonemissivepropertiesofcarbonnanotubesfilms
AT wronkahalina influenceofdurationtimeofcvdprocessonemissivepropertiesofcarbonnanotubesfilms
AT czerwoszelzbieta influenceofdurationtimeofcvdprocessonemissivepropertiesofcarbonnanotubesfilms
AT sobczakkamil influenceofdurationtimeofcvdprocessonemissivepropertiesofcarbonnanotubesfilms
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