The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measuremen...
Main Authors: | Górecki Krzysztof, Górecki Paweł |
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Format: | Article |
Language: | English |
Published: |
Polish Academy of Sciences
2015-09-01
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Series: | Metrology and Measurement Systems |
Subjects: | |
Online Access: | http://www.degruyter.com/view/j/mms.2015.22.issue-3/mms-2015-0036/mms-2015-0036.xml?format=INT |
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