The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs

The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs

In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measuremen...

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Main Authors: Górecki Krzysztof, Górecki Paweł
Format: Article
Language:English
Published: Polish Academy of Sciences 2015-09-01
Series:Metrology and Measurement Systems
Subjects:
IGBT
thermal resistance
measurements
transistor
semiconductor devices
Online Access:http://www.degruyter.com/view/j/mms.2015.22.issue-3/mms-2015-0036/mms-2015-0036.xml?format=INT
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spelling doaj-2a3e8d0f55ce477f9a15157b8249a9412020-11-25T01:23:55ZengPolish Academy of SciencesMetrology and Measurement Systems2300-19412015-09-0122345546410.1515/mms-2015-0036mms-2015-0036The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTsGórecki Krzysztof0Górecki Paweł1Gdynia Maritime University, Faculty of Electrical Engineering, Morska 83, 81-225 Gdynia, PolandGdynia Maritime University, Faculty of Electrical Engineering, Morska 83, 81-225 Gdynia, PolandIn the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.http://www.degruyter.com/view/j/mms.2015.22.issue-3/mms-2015-0036/mms-2015-0036.xml?format=INTIGBTthermal resistancemeasurementstransistorsemiconductor devices
collection DOAJ
language English
format Article
sources DOAJ
author Górecki Krzysztof
Górecki Paweł
spellingShingle Górecki Krzysztof
Górecki Paweł
The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
Metrology and Measurement Systems
IGBT
thermal resistance
measurements
transistor
semiconductor devices
author_facet Górecki Krzysztof
Górecki Paweł
author_sort Górecki Krzysztof
title The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
title_short The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
title_full The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
title_fullStr The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
title_full_unstemmed The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
title_sort analysis of accuracy of selected methods of measuring the thermal resistance of igbts
publisher Polish Academy of Sciences
series Metrology and Measurement Systems
issn 2300-1941
publishDate 2015-09-01
description In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.
topic IGBT
thermal resistance
measurements
transistor
semiconductor devices
url http://www.degruyter.com/view/j/mms.2015.22.issue-3/mms-2015-0036/mms-2015-0036.xml?format=INT
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AT goreckipaweł analysisofaccuracyofselectedmethodsofmeasuringthethermalresistanceofigbts
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