Multi-Level Simulated Fault Injection for Data Dependent Reliability Analysis of RTL Circuit Descriptions

Multi-Level Simulated Fault Injection for Data Dependent Reliability Analysis of RTL Circuit Descriptions

This paper proposes data-dependent reliability evaluation methodology for digital systems described at Register Transfer Level (RTL). It uses a hybrid hierarchical approach, combining the accuracy provided by Gate Level (GL) Simulated Fault Injection (SFI) and the low simulation overhead required...

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Bibliographic Details
Main Authors: NIMARA, S., AMARICAI, A., BONCALO, O., POPA, M.
Format: Article
Language:English
Published: Stefan cel Mare University of Suceava 2016-02-01
Series:Advances in Electrical and Computer Engineering
Subjects:
digital circuits
probabilistic circuits
register transfer level
reliability
simulated fault injection
Online Access:http://dx.doi.org/10.4316/AECE.2016.01013

Internet

http://dx.doi.org/10.4316/AECE.2016.01013

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