Effect of Etching Parameter on Pore Size and Porosity of Electrochemically Formed Nanoporous Silicon
The most common fabrication technique of porous silicon (PS) is electrochemical etching of a crystalline silicon wafer in a hydrofluoric (HF) acid-based solution. The electrochemical process allows for precise control of the properties of PS such as thickness of the porous layer, porosity, and avera...
Main Authors: | , |
---|---|
Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2007-01-01
|
Series: | Journal of Nanomaterials |
Online Access: | http://dx.doi.org/10.1155/2007/89718 |
id |
doaj-25749e4f77ee4cc49ca9d3c13e290f2a |
---|---|
record_format |
Article |
spelling |
doaj-25749e4f77ee4cc49ca9d3c13e290f2a2020-11-25T00:15:34ZengHindawi LimitedJournal of Nanomaterials1687-41101687-41292007-01-01200710.1155/2007/8971889718Effect of Etching Parameter on Pore Size and Porosity of Electrochemically Formed Nanoporous SiliconPushpendra Kumar0Patrick Huber1Faculty of Physics and Mechatronic Engineering, Saarland University, Saarbrücken 66041, GermanyFaculty of Physics and Mechatronic Engineering, Saarland University, Saarbrücken 66041, GermanyThe most common fabrication technique of porous silicon (PS) is electrochemical etching of a crystalline silicon wafer in a hydrofluoric (HF) acid-based solution. The electrochemical process allows for precise control of the properties of PS such as thickness of the porous layer, porosity, and average pore diameter. The control of these properties of PS was shown to depend on the HF concentration in the used electrolyte, the applied current density, and the thickness of PS. The change in pore diameter, porosity, and specific surface area of PS was investigated by measuring nitrogen sorption isotherms.http://dx.doi.org/10.1155/2007/89718 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Pushpendra Kumar Patrick Huber |
spellingShingle |
Pushpendra Kumar Patrick Huber Effect of Etching Parameter on Pore Size and Porosity of Electrochemically Formed Nanoporous Silicon Journal of Nanomaterials |
author_facet |
Pushpendra Kumar Patrick Huber |
author_sort |
Pushpendra Kumar |
title |
Effect of Etching Parameter on Pore Size and Porosity of Electrochemically Formed Nanoporous Silicon |
title_short |
Effect of Etching Parameter on Pore Size and Porosity of Electrochemically Formed Nanoporous Silicon |
title_full |
Effect of Etching Parameter on Pore Size and Porosity of Electrochemically Formed Nanoporous Silicon |
title_fullStr |
Effect of Etching Parameter on Pore Size and Porosity of Electrochemically Formed Nanoporous Silicon |
title_full_unstemmed |
Effect of Etching Parameter on Pore Size and Porosity of Electrochemically Formed Nanoporous Silicon |
title_sort |
effect of etching parameter on pore size and porosity of electrochemically formed nanoporous silicon |
publisher |
Hindawi Limited |
series |
Journal of Nanomaterials |
issn |
1687-4110 1687-4129 |
publishDate |
2007-01-01 |
description |
The most common fabrication technique of porous silicon (PS) is electrochemical etching of a crystalline silicon wafer in a hydrofluoric (HF) acid-based solution. The electrochemical process allows for precise control of the properties of PS such as thickness of the porous layer, porosity, and average pore diameter. The control of these properties of PS was shown to depend on the HF concentration in the used electrolyte, the applied current density, and the thickness of PS. The change in pore diameter, porosity, and specific surface area of PS was investigated by measuring nitrogen sorption isotherms. |
url |
http://dx.doi.org/10.1155/2007/89718 |
work_keys_str_mv |
AT pushpendrakumar effectofetchingparameteronporesizeandporosityofelectrochemicallyformednanoporoussilicon AT patrickhuber effectofetchingparameteronporesizeandporosityofelectrochemicallyformednanoporoussilicon |
_version_ |
1725386160408100864 |