Defect Imaging Enhancement through Optimized Shape Factors of the RAPID Algorithm Based on Guided Wave Beam Pattern Analysis

In this study, a modified imaging algorithm was implemented to improve the imaging accuracy for defects located on a structure. Based on analysis of the Lamb wave mode, a guided ultrasonic wave inspection technique was applied, which was able to illustrate images of defects in a 6 mm steel plate sim...

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Bibliographic Details
Main Authors: Yonghee Lee, Younho Cho
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/21/12/4029