Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)

Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)

Ultrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, dome-, and relaxed clusters on Si(001) upon femtosecond laser excitation. Utilizing the difference in size and strain state the response of hut- and dome c...

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Main Authors: T. Frigge, B. Hafke, V. Tinnemann, T. Witte, M. Horn-von Hoegen
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2015-05-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/1.4922023
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spelling doaj-2511a7ce6ce94beeb9213e5ebda050b82020-11-24T22:10:03ZengAIP Publishing LLC and ACAStructural Dynamics2329-77782015-05-0123035101035101-1010.1063/1.4922023002503SDYSpot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)T. Frigge0B. Hafke1V. Tinnemann2T. Witte3M. Horn-von Hoegen4Department of Physics and Center for Nanointegration (CENIDE), University of Duisburg-Essen, Lotharstr. 1, 47057 Duisburg, GermanyDepartment of Physics and Center for Nanointegration (CENIDE), University of Duisburg-Essen, Lotharstr. 1, 47057 Duisburg, GermanyDepartment of Physics and Center for Nanointegration (CENIDE), University of Duisburg-Essen, Lotharstr. 1, 47057 Duisburg, GermanyDepartment of Physics and Center for Nanointegration (CENIDE), University of Duisburg-Essen, Lotharstr. 1, 47057 Duisburg, GermanyDepartment of Physics and Center for Nanointegration (CENIDE), University of Duisburg-Essen, Lotharstr. 1, 47057 Duisburg, GermanyUltrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, dome-, and relaxed clusters on Si(001) upon femtosecond laser excitation. Utilizing the difference in size and strain state the response of hut- and dome clusters can be distinguished by a transient spot profile analysis. Surface diffraction from {105}-type facets provide exclusive information on hut clusters. A pixel-by-pixel analysis of the dynamics of the entire diffraction pattern gives time constants of 40, 160, and 390 ps, which are assigned to the cooling time constants for hut-, dome-, and relaxed clusters.http://dx.doi.org/10.1063/1.4922023
collection DOAJ
language English
format Article
sources DOAJ
author T. Frigge
B. Hafke
V. Tinnemann
T. Witte
M. Horn-von Hoegen
spellingShingle T. Frigge
B. Hafke
V. Tinnemann
T. Witte
M. Horn-von Hoegen
Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)
Structural Dynamics
author_facet T. Frigge
B. Hafke
V. Tinnemann
T. Witte
M. Horn-von Hoegen
author_sort T. Frigge
title Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)
title_short Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)
title_full Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)
title_fullStr Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)
title_full_unstemmed Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)
title_sort spot profile analysis and lifetime mapping in ultrafast electron diffraction: lattice excitation of self-organized ge nanostructures on si(001)
publisher AIP Publishing LLC and ACA
series Structural Dynamics
issn 2329-7778
publishDate 2015-05-01
description Ultrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, dome-, and relaxed clusters on Si(001) upon femtosecond laser excitation. Utilizing the difference in size and strain state the response of hut- and dome clusters can be distinguished by a transient spot profile analysis. Surface diffraction from {105}-type facets provide exclusive information on hut clusters. A pixel-by-pixel analysis of the dynamics of the entire diffraction pattern gives time constants of 40, 160, and 390 ps, which are assigned to the cooling time constants for hut-, dome-, and relaxed clusters.
url http://dx.doi.org/10.1063/1.4922023
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