Atomic Oxygen-Resistant Polyimide Composite Films Containing Nanocaged Polyhedral Oligomeric Silsesquioxane Components in Matrix and Fillers

• Main Authors: Yan Zhang, Hao Wu, Yi-dan Guo, Yan-bin Yang, Qiang Yu, Jin-gang Liu, Bo-han Wu, Feng-zhu Lv
• Format: Article
• Language: English
• Published: MDPI AG 2021-01-01
• Series: Nanomaterials
• Subjects: polyimide film; polyhedral oligomeric silsesquioxane; atomic oxygen; thermal properties; self-healing
• Online Access: https://www.mdpi.com/2079-4991/11/1/141
• ISSN: 2079-4991

For the development of spacecraft with long-servicing life in low earth orbit (LEO), high-temperature resistant polymer films with long-term atomic oxygen (AO) resistant features are highly desired. The relatively poor AO resistance of standard polyimide (PI) films greatly limited their applications in LEO spacecraft. In this work, we successfully prepared a series of novel AO resistant PI composite films containing nanocaged polyhedral oligomeric silsesquioxane (POSS) components in both the PI matrix and the fillers. The POSS-containing PI matrix film was prepared from a POSS-substituted aromatic diamine, <i>N</i>-[(heptaisobutyl-POSS)propyl]-3,5-diaminobenzamide (DABA-POSS) and a common aromatic diamine, 4,4′-oxydianline (ODA) and the aromatic dianhydride, pyromellitic dianhydride (PMDA) by a two-step thermal imidization procedure. The POSS-containing filler, trisilanolphenyl POSS (TSP-POSS) was added with the fixed proportion of 20 wt% in the final films. Incorporation of TSP-POSS additive apparently improved the thermal stability, but decreased the high-temperature dimensional stable nature of the PI composite films. The 5% weight loss temperature (<i>T</i>_5%) of POSS-PI-20 with 20 wt% of DABA-POSS is 564 °C, and its coefficient of linear thermal expansion (CTE) is 81.0 × 10⁻⁶/K. The former is 16 °C lower and the latter was 20.0 × 10⁻⁶/K higher than those of the POSS-PI-10 film (<i>T</i>_5% = 580 °C, CTE = 61.0 × 10⁻⁶/K), respectively. POSS components endowed the PI composite films excellent AO resistance and self-healing characteristics in AO environments. POSS-PI-30 exhibits the lowest AO erosion yield (<i>E</i>_s) of 1.64 × 10⁻²⁶ cm³/atom under AO exposure with a flux of 2.51 × 10²¹ atoms/cm², which is more than two orders of magnitude lower than the referenced PI (PMDA-ODA) film. Inert silica or silicate passivation layers were detected on the surface of the PI composite films exposed to AO.