Theoretical study on lowering loss of skin effect suppressed multi-layer transmission line with positive/negative (Cu/NiFe) permeability materials for high data-rate and low delay-time I/O interface board
This paper proposes a new application of skin effect suppression technology for long wiring on high-speed & low-delay I/O board. This proposal will overcome the difficulty of further reducing the transmission losses on the I/O board with vert >vert 50 Gb/s data rate. In previous research, it...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2020-01-01
|
| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5130003 |