Anomaly Detection in Discrete Manufacturing Systems by Pattern Relation Table Approaches

• Main Authors: Xinmiao Sun, Ruiqi Li, Zhen Yuan
• Format: Article
• Language: English
• Published: MDPI AG 2020-10-01
• Series: Sensors
• Subjects: anomaly detection; discrete manufacturing systems; pattern relation table; centralized algorithm; parallel algorithm; Timed Petri Net
• Online Access: https://www.mdpi.com/1424-8220/20/20/5766

Anomaly detection for discrete manufacturing systems is important in intelligent manufacturing. In this paper, we address the problem of anomaly detection for the discrete manufacturing systems with complicated processes, including parallel processes, loop processes, and/or parallel with nested loop sub-processes. Such systems can generate a series of discrete event data during normal operations. Existing methods that deal with the discrete sequence data may not be efficient for the discrete manufacturing systems or methods that are dealing with manufacturing systems only focus on some specific systems. In this paper, we take the middle way and seek to propose an efficient algorithm by applying only the system structure information. Motivated by the system structure information that the loop processes may result in repeated events, we propose two algorithms—centralized pattern relation table algorithm and parallel pattern relation table algorithm—to build one or multiple relation tables between loop pattern elements and individual events. The effectiveness of the proposed algorithms is tested by two artificial data sets that are generated by Timed Petri Nets. The experimental results show that the proposed algorithms can achieve higher AUC and F1-score, even with smaller sized data set compared to the other algorithms and that the parallel algorithm achieves the highest performance with the smallest data set.