Main Parameters Characterization of Bulk CMOS Cross-Like Hall Structures
A detailed analysis of the cross-like Hall cells integrated in regular bulk CMOS technological process is performed. To this purpose their main parameters have been evaluated. A three-dimensional physical model was employed in order to evaluate the structures. On this occasion, numerical information...
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| Format: | Article |
| Language: | English |
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Hindawi Limited
2016-01-01
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| Series: | Advances in Materials Science and Engineering |
| Online Access: | http://dx.doi.org/10.1155/2016/6279162 |