Síntese e caracterização de nanocompósitos Ni: SiO2 processados na forma de filmes finos Synthesis and characterization of Ni: SiO2 nanocomposites processed as thin films

<abstract language="eng">We have produced nanocomposite films of Ni:SiO2 by an alternative polymeric precursor route. Films, with thickness of ~ 1000 nm, were characterized by several techniques including X-ray diffraction, scanning electron microscopy, atomic force microscopy, flame...

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Bibliographic Details
Main Authors: Paulo Sérgio Gouveia, Marcia Tsuijama Escote, Elson Longo, Edson R. Leite, Neftali L. V. Carreño, Fabio C. Fonseca, Renato de F. Jardim
Format: Article
Language:English
Published: Sociedade Brasileira de Química 2005-10-01
Series:Química Nova
Subjects:
Online Access:http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-40422005000500022