Characterization of Graphite Oxide and Reduced Graphene Oxide Obtained from Different Graphite Precursors and Oxidized by Different Methods Using Raman Spectroscopy Statistical Analysis

• Main Authors: Roksana Muzyka, Sabina Drewniak, Tadeusz Pustelny, Marcin Sajdak, Łukasz Drewniak
• Format: Article
• Language: English
• Published: MDPI AG 2021-02-01
• Series: Materials
• Subjects: graphite; graphite oxide; reduced graphene oxide; Raman spectroscopy; XRD; XPS
• Online Access: https://www.mdpi.com/1996-1944/14/4/769

In this paper, various graphite oxide (GO) and reduced graphene oxide (rGO) preparation methods are analyzed. The obtained materials differed in their properties, including (among others) their oxygen contents. The chemical and structural properties of graphite, graphite oxides, and reduced graphene oxides were previously investigated using Raman spectroscopy (RS), X-ray photoelectron spectroscopy (XPS), and X-ray diffraction (XRD). In this paper, hierarchical clustering analysis (HCA) and analysis of variance (ANOVA) were used to trace the directions of changes of the selected parameters relative to a preparation method of such oxides. We showed that the oxidation methods affected the physicochemical properties of the final products. The aim of the research was the statistical analysis of the selected properties in order to use this information to design graphene oxide materials with properties relevant for specific applications (i.e., in gas sensors).