Element Specific Versus Integral Structural and Magnetic Properties of Co:ZnO and Gd:GaN Probed with Hard X-ray Absorption Spectroscopy

• Main Author: Andreas Ney
• Format: Article
• Language: English
• Published: MDPI AG 2010-06-01
• Series: Materials
• Subjects: dilute magnetic semiconductors; magnetic properties; X-ray absorption spectroscopy
• Online Access: http://www.mdpi.com/1996-1944/3/6/3565/

Dilute magnetic semiconductors (DMS) are envisioned as sources of spin-polarized carriers for future semiconductor devices which simultaneously utilize spin and charge of the carriers. The hope of discovering a DMS with ferromagnetic order up to room temperature still motivates research on suitable DMS materials. Two candidate wide-band gap DMS are Gd:GaN and Co:ZnO. We have used hard X-ray absorption spectroscopy (XAS) and in particular X-ray linear dichroism (XLD) and X-ray magnetic circular dichroism (XMCD) to study both DMS materials with element specificity and compare these findings with results from integral SQUID magnetometry as well as electron paramagnetic resonance (EPR).