Mesostructured HfO2/Al2O3 Composite Thin Films with Reduced Leakage Current for Ion-Conducting Devices

Bibliographic Details
Main Authors: Mohamed Barakat Zakaria, Takahiro Nagata, Toyohiro Chikyow
Format: Article
Language:English
Published: American Chemical Society 2019-08-01
Series:ACS Omega
Online Access:http://dx.doi.org/10.1021/acsomega.9b01095