An analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocomposites
Basing on the dependence of tunneling current fluctuations on the local conductivity of a non-uniform media, we propose to apply the computational technique mathematically equivalent to the speckle contrast calculations for pattern recognition in low-contrast images obtained via the scanning tunneli...
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2019-06-01
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doaj-200ebcac703c447d9ec4bfc07988a9c92020-11-25T01:09:28ZengElsevierResults in Physics2211-37972019-06-0113An analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocompositesNikita A. Emelianov0Pavel V. Abakumov1Eugene B. Postnikov2Kursk State University, Radishcheva Str. 33, Kursk 305000, Russia; Corresponding author.Southwest State University, 50 let Oktyabrya Str. 94, Kursk 305040, RussiaKursk State University, Radishcheva Str. 33, Kursk 305000, RussiaBasing on the dependence of tunneling current fluctuations on the local conductivity of a non-uniform media, we propose to apply the computational technique mathematically equivalent to the speckle contrast calculations for pattern recognition in low-contrast images obtained via the scanning tunneling microscopy. As a case study, the revealing BaTiO3 nanoparticles filling conductive polyaniline matrix is considered. Keywords: STM, LASCA, Image processinghttp://www.sciencedirect.com/science/article/pii/S2211379719303146 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Nikita A. Emelianov Pavel V. Abakumov Eugene B. Postnikov |
spellingShingle |
Nikita A. Emelianov Pavel V. Abakumov Eugene B. Postnikov An analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocomposites Results in Physics |
author_facet |
Nikita A. Emelianov Pavel V. Abakumov Eugene B. Postnikov |
author_sort |
Nikita A. Emelianov |
title |
An analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocomposites |
title_short |
An analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocomposites |
title_full |
An analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocomposites |
title_fullStr |
An analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocomposites |
title_full_unstemmed |
An analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocomposites |
title_sort |
analogue of the speckle contrast technique for low-conducting features enhancement in scanning tunneling microscopy images of nanocomposites |
publisher |
Elsevier |
series |
Results in Physics |
issn |
2211-3797 |
publishDate |
2019-06-01 |
description |
Basing on the dependence of tunneling current fluctuations on the local conductivity of a non-uniform media, we propose to apply the computational technique mathematically equivalent to the speckle contrast calculations for pattern recognition in low-contrast images obtained via the scanning tunneling microscopy. As a case study, the revealing BaTiO3 nanoparticles filling conductive polyaniline matrix is considered. Keywords: STM, LASCA, Image processing |
url |
http://www.sciencedirect.com/science/article/pii/S2211379719303146 |
work_keys_str_mv |
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