Using TOF-SIMS Spectrometry to Study the Kinetics of the Interfacial Retro Diels–Alder Reaction

Using TOF-SIMS Spectrometry to Study the Kinetics of the Interfacial Retro Diels–Alder Reaction

In this work, the use of Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) was explored as a technique for monitoring the interfacial retro Diels–Alder (retro DA) reaction occurring on well-controlled self-assembled monolayers (SAMs). A molecule containing a Diels–Alder (DA) adduct was graft...

Full description

Bibliographic Details
Main Authors: Lilia Hassouna, Sachin Kumar Enganati, Florence Bally-Le Gall, Grégory Mertz, Jérôme Bour, David Ruch, Vincent Roucoules
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Materials
Subjects:
interfacial reaction
retro Diels–Alder
kinetics
TOF-SIMS
Online Access:https://www.mdpi.com/1996-1944/14/10/2674

Similar Items

Similar Items