Anomaly Detection in Nanofibrous Materials by CNN-Based Self-Similarity
Automatic detection and localization of anomalies in nanofibrous materials help to reduce the cost of the production process and the time of the post-production visual inspection process. Amongst all the monitoring methods, those exploiting Scanning Electron Microscope (SEM) imaging are the most eff...
Main Authors: | Paolo Napoletano, Flavio Piccoli, Raimondo Schettini |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2018-01-01
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Series: | Sensors |
Subjects: | |
Online Access: | http://www.mdpi.com/1424-8220/18/1/209 |
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