A New Approach to the Habit Determination of Nano-objects by SEM
A novel approach to the inspection of nanoparticle habit was proposed in our previous papers. This approach is based on a joint analysis of two scanning electron microscopy (SEM) images corresponding to different convergences of illuminating electron beams. However, increasing convergence worsens an...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
SAGE Publishing
2013-06-01
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| Series: | Nanomaterials and Nanotechnology |
| Subjects: | |
| Online Access: | http://www.intechopen.com/journals/nanomaterials_and_nanotechnology/a-new-approach-to-the-habit-determination-of-nano-objects-by-sem |
| Summary: | A novel approach to the inspection of
nanoparticle habit was proposed in our previous papers.
This approach is based on a joint analysis of two scanning
electron microscopy (SEM) images corresponding to
different convergences of illuminating electron beams.
However, increasing convergence worsens an image as
the result of spherical aberration. Therefore, for the first
time in this paper we describe in detail a new approach
which is an alternative to the method of two
convergences. It is based on the use of two defocusings
which are identical in size, but opposite in signs, thereby.
simplifying the demands of SEM. |
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| ISSN: | 1847-9804 |