Modelling of Temperature Coefficient of Resistance of a Thin Film RTDTowardsExhaust Gas Measurement Applications

Bibliographic Details
Main Authors: Anthony Maher, Vijayalakshmi Velusamy, Daniel Riordan, Joseph Walsh
Format: Article
Language:English
Published: Exeley Inc. 2014-12-01
Series:International Journal on Smart Sensing and Intelligent Systems
Subjects:
Online Access:https://www.exeley.com/exeley/journals/in_jour_smart_sensing_and_intelligent_systems/7/5/pdf/10.21307_ijssis-2019-026.pdf