Microstructure and erosion characteristics of Ni-AlN thin films prepared by electrodeposition
Ni-AlN thin films were successfully fabricated via direct-current (DC), pulse-current (PC), and ultrasonic-assisted pulse-current (UAPC) deposition. The microstructure, microhardness, and erosion characteristics of the Ni-AlN thin films were determined with the use of scanning probe microscopy (SPM)...
Main Authors: | Li Wei, Zhu Yongyong, Xia Fafeng |
---|---|
Format: | Article |
Language: | English |
Published: |
De Gruyter
2016-07-01
|
Series: | Science and Engineering of Composite Materials |
Subjects: | |
Online Access: | https://doi.org/10.1515/secm-2014-0182 |
Similar Items
-
MORPHOLOGY AND OPTICAL PROPERTIES OF AlN FILMS ON SAPPHIRE
by: Oleg V. Devitsky, et al.
Published: (2019-12-01) -
Optical properties of AlN layers obtained by magnetron sputtering
by: Potera Piotr, et al.
Published: (2018-12-01) -
Dislocation Energetics and Pop-Ins in AlN Thin Films by Berkovich Nanoindentation
by: Jenh-Yih Juang, et al.
Published: (2013-09-01) -
Features of the receiving of piezoelectric thin films by plasma spraying of powdery AlN
by: V. S. Feshchenko, et al.
Published: (2020-03-01) -
Fabrication of Weak C-Axis Preferred AlN Thin Film for Temperature Measurement
by: Ling Dong, et al.
Published: (2021-08-01)