Microscopic optoelectronic defectoscopy of solar cells

Microscopic optoelectronic defectoscopy of solar cells

Scanning probe microscopes are powerful tool for micro- or nanoscale diagnostics of defects in crystalline silicon solar cells. Solar cell is a large p-n junction semiconductor device. Its quality is strongly damaged by the presence of defects. If the cell works under low reverse-biased voltage,...

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Main Authors: Dallaeva D., Koktavý P., Tománek P., Škarvada P.
Format: Article
Language:English
Published: EDP Sciences 2013-05-01
Series:EPJ Web of Conferences
Online Access:http://dx.doi.org/10.1051/epjconf/20134800026
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spelling doaj-1c2d0c7d355d4b3094200b8bcc05e11d2021-08-02T01:41:47ZengEDP SciencesEPJ Web of Conferences2100-014X2013-05-01480002610.1051/epjconf/20134800026Microscopic optoelectronic defectoscopy of solar cellsDallaeva D.Koktavý P.Tománek P.Škarvada P.Scanning probe microscopes are powerful tool for micro- or nanoscale diagnostics of defects in crystalline silicon solar cells. Solar cell is a large p-n junction semiconductor device. Its quality is strongly damaged by the presence of defects. If the cell works under low reverse-biased voltage, defects emit a light in visible range. The suggested method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current and thus provides more complex information. To prove its feasibility, we have selected one defect (truncated pyramid) in the sample, which emitted light under low reverse-biased voltage. http://dx.doi.org/10.1051/epjconf/20134800026
collection DOAJ
language English
format Article
sources DOAJ
author Dallaeva D.
Koktavý P.
Tománek P.
Škarvada P.
spellingShingle Dallaeva D.
Koktavý P.
Tománek P.
Škarvada P.
Microscopic optoelectronic defectoscopy of solar cells
EPJ Web of Conferences
author_facet Dallaeva D.
Koktavý P.
Tománek P.
Škarvada P.
author_sort Dallaeva D.
title Microscopic optoelectronic defectoscopy of solar cells
title_short Microscopic optoelectronic defectoscopy of solar cells
title_full Microscopic optoelectronic defectoscopy of solar cells
title_fullStr Microscopic optoelectronic defectoscopy of solar cells
title_full_unstemmed Microscopic optoelectronic defectoscopy of solar cells
title_sort microscopic optoelectronic defectoscopy of solar cells
publisher EDP Sciences
series EPJ Web of Conferences
issn 2100-014X
publishDate 2013-05-01
description Scanning probe microscopes are powerful tool for micro- or nanoscale diagnostics of defects in crystalline silicon solar cells. Solar cell is a large p-n junction semiconductor device. Its quality is strongly damaged by the presence of defects. If the cell works under low reverse-biased voltage, defects emit a light in visible range. The suggested method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current and thus provides more complex information. To prove its feasibility, we have selected one defect (truncated pyramid) in the sample, which emitted light under low reverse-biased voltage.
url http://dx.doi.org/10.1051/epjconf/20134800026
work_keys_str_mv AT dallaevad microscopicoptoelectronicdefectoscopyofsolarcells
AT koktavyp microscopicoptoelectronicdefectoscopyofsolarcells
AT tomanekp microscopicoptoelectronicdefectoscopyofsolarcells
AT skarvadap microscopicoptoelectronicdefectoscopyofsolarcells
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