Radiation damage buildup by athermal defect reactions in nickel and concentrated nickel alloys

• Main Authors: S. Zhang, K. Nordlund, F. Djurabekova, F. Granberg, Y. Zhang, T. S. Wang
• Format: Article
• Language: English
• Published: Taylor & Francis Group 2017-11-01
• Series: Materials Research Letters
• Subjects: Radiation damage; damage buildup; concentrated solid solution alloys; Rutherford backscattering spectrometry; molecular dynamics; binary collision approximation
• Online Access: http://dx.doi.org/10.1080/21663831.2017.1311284

We develop a new method using binary collision approximation simulating the Rutherford backscattering spectrometry in channeling conditions (RBS/C) from molecular dynamics atom coordinates of irradiated cells. The approach allows comparing experimental and simulated RBS/C signals as a function of depth without fitting parameters. The simulated RBS/C spectra of irradiated Ni and concentrated solid solution alloys (CSAs, NiFe and NiCoCr) show a good agreement with the experimental results. The good agreement indicates the damage evolution under damage overlap conditions in Ni and CSAs at room temperature is dominated by defect recombination and migration induced by irradiation rather than activated thermally.