XPS investigations of MOCVD tin oxide thin layers on Si nanowires array

Tin oxide thin layers were grown by metal-organic chemical vapor deposition technique on the top-down nanostructured silicon nanowires array obtained by metal-assisted wet-chemical technique from single crystalline silicon wafers. The composition of the formed layers were studied by high-resolution...

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Bibliographic Details
Main Authors: S.Yu. Turishchev, O.A. Chuvenkova, E.V. Parinova, D.A. Koyuda, R.G. Chumakov, M. Presselt, A. Schleusener, V. Sivakov
Format: Article
Language:English
Published: Elsevier 2018-12-01
Series:Results in Physics
Online Access:http://www.sciencedirect.com/science/article/pii/S2211379718320369