The algorithmic programs for optimal growth conditions selection in growing of GaAs-based epitaxial layers by MOCVD.
The algorithm was worked out, witch allows to define obtained GaAs-based layers characteristics and the most significant epitaxy process technological parameters on the base of half-empiric dependences, if MOCVD process carriage conditions are known.
Main Authors: | A. A. Marmalyuk, D. E. Arbenin, E. V. Burlyaeva |
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Format: | Article |
Language: | Russian |
Published: |
MIREA - Russian Technological University
2009-04-01
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Series: | Тонкие химические технологии |
Subjects: | |
Online Access: | https://www.finechem-mirea.ru/jour/article/view/1105 |
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