Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control System

Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control System

This paper describes a software algorithm for detecting defective insulating structures using infrared images. The defect detection criteria are based on a joint analysis of the mean and standard value of the brightness distribution of a set of insulators. The effectiveness of the developed criteria...

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Main Authors: Zaripova Alina, Zaripov Damir, Usachev Alexander
Format: Article
Language:English
Published: EDP Sciences 2021-01-01
Series:E3S Web of Conferences
Online Access:https://www.e3s-conferences.org/articles/e3sconf/pdf/2021/64/e3sconf_suse2021_01070.pdf
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spelling doaj-18438b21fc624a01ba5777dba731910e2021-07-15T06:53:02ZengEDP SciencesE3S Web of Conferences2267-12422021-01-012880107010.1051/e3sconf/202128801070e3sconf_suse2021_01070Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control SystemZaripova Alina0Zaripov Damir1Usachev Alexander2OOO «GDC Services»Kazan State Power Engineering UniversityKazan State Power Engineering UniversityThis paper describes a software algorithm for detecting defective insulating structures using infrared images. The defect detection criteria are based on a joint analysis of the mean and standard value of the brightness distribution of a set of insulators. The effectiveness of the developed criteria is substantiated by the results of laboratory tests of a significant number of insulators removed from high-voltage lines according to the results of thermal imaging diagnostics. Simultaneous analysis of thermograms of the same type of insulating structures according to the proposed algorithm is more effective in comparison with the subjective assessment of each of them separately, which was used earlier. In addition, this approach allows to reduce the time of analysis and decision-making based on the results of diagnostics.https://www.e3s-conferences.org/articles/e3sconf/pdf/2021/64/e3sconf_suse2021_01070.pdf
collection DOAJ
language English
format Article
sources DOAJ
author Zaripova Alina
Zaripov Damir
Usachev Alexander
spellingShingle Zaripova Alina
Zaripov Damir
Usachev Alexander
Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control System
E3S Web of Conferences
author_facet Zaripova Alina
Zaripov Damir
Usachev Alexander
author_sort Zaripova Alina
title Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control System
title_short Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control System
title_full Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control System
title_fullStr Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control System
title_full_unstemmed Investigation of the Algorithm to Find Defects in High-voltage Insulators for an Automated Thermal Imaging Control System
title_sort investigation of the algorithm to find defects in high-voltage insulators for an automated thermal imaging control system
publisher EDP Sciences
series E3S Web of Conferences
issn 2267-1242
publishDate 2021-01-01
description This paper describes a software algorithm for detecting defective insulating structures using infrared images. The defect detection criteria are based on a joint analysis of the mean and standard value of the brightness distribution of a set of insulators. The effectiveness of the developed criteria is substantiated by the results of laboratory tests of a significant number of insulators removed from high-voltage lines according to the results of thermal imaging diagnostics. Simultaneous analysis of thermograms of the same type of insulating structures according to the proposed algorithm is more effective in comparison with the subjective assessment of each of them separately, which was used earlier. In addition, this approach allows to reduce the time of analysis and decision-making based on the results of diagnostics.
url https://www.e3s-conferences.org/articles/e3sconf/pdf/2021/64/e3sconf_suse2021_01070.pdf
work_keys_str_mv AT zaripovaalina investigationofthealgorithmtofinddefectsinhighvoltageinsulatorsforanautomatedthermalimagingcontrolsystem
AT zaripovdamir investigationofthealgorithmtofinddefectsinhighvoltageinsulatorsforanautomatedthermalimagingcontrolsystem
AT usachevalexander investigationofthealgorithmtofinddefectsinhighvoltageinsulatorsforanautomatedthermalimagingcontrolsystem
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