Various anti-fuse structures for field programmable gate arrays and programmable read-only memories

Various anti-fuse structures for field programmable gate arrays and programmable read-only memories

The use of anti-fuses as programmable elements is becoming popular in field programmable gate arrays and programmable read-only memories. The characteristics of various structures of anti-fuses and compromise between performance and reliability will be discussed in this paper.

Bibliographic Details
Main Authors:	V. A. Petrovich, V. P. Bondarenko, A. L. Dolgiy, S. V. Redko
Format:	Article
Language:	Russian
Published:	Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:	Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:	anti-fuse field programmable gate array programmable read-only memory
Online Access:	https://doklady.bsuir.by/jour/article/view/1009

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